Xiaqing Wen

Title: Xiaqing Wen: Innovator in Logic Circuit Testing

Introduction

Xiaqing Wen is a notable inventor based in Fukuoka, Japan. He has made significant contributions to the field of logic circuit testing through his innovative patent. His work focuses on enhancing the efficiency and effectiveness of testing methods for logic circuits.

Latest Patents

Xiaqing Wen holds a patent for a conversion device, conversion method, program, and recording medium. This invention provides a solution for converting an initial test pattern into a test pattern with different logic values, while maintaining fault coverage for transition delay faults. The conversion device is designed to transform an initial test pattern for a logic circuit into an intermediate test pattern, ensuring that the detection conditions for faults are met.

Career Highlights

Throughout his career, Xiaqing Wen has worked with esteemed organizations such as the Japan Science and Technology Agency and the Kyushu Institute of Technology. His experience in these institutions has allowed him to develop and refine his innovative ideas in the realm of logic circuit testing.

Collaborations

Xiaqing Wen has collaborated with notable colleagues, including Seiji Kajihara and Kohei Miyase. These partnerships have contributed to the advancement of his research and the successful development of his patent.

Conclusion

Xiaqing Wen's contributions to the field of logic circuit testing through his innovative patent demonstrate his expertise and commitment to advancing technology. His work continues to influence the industry and pave the way for future innovations.