The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 07, 2015

Filed:

Sep. 28, 2011
Applicants:

Yasuo Sato, Iizuka, JP;

Seiji Kajihara, Iizuka, JP;

Inventors:

Yasuo Sato, Iizuka, JP;

Seiji Kajihara, Iizuka, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/3185 (2006.01); G01R 31/3177 (2006.01);
U.S. Cl.
CPC ...
G01R 31/3177 (2013.01); G01R 31/318547 (2013.01); G01R 31/318566 (2013.01);
Abstract

It is a purpose of the invention to provide a fault detection system, etc., having improved fault coverage with a reduced number of test patterns to be input to a logic circuit. The fault detection system detects a fault in a logic circuit based on multiple output logic values of the logic circuit after a test input pattern is input. The output logic values are input to the logic circuit as an updated test input pattern. The system comprises: a first acquisition unit which acquires a part of or all of the output logic values; a comparison unit which compares the logic values acquired by the first acquisition unit with those predicted for when there are no faults, or for when there is a specific fault; and a fault judgment unit which judges whether or not there is a fault based on the comparison result obtained by the comparison unit.


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