Seongnam, South Korea

Sang-il Park

This inventor holds 18 USPTO granted patents and 2 published patent applications, primarily in Atomic Force Microscopy. Top assignees: Park Systems Corporation, Hynix Semiconductor Inc., Psia Corporation. Active years: 2005-2025.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Sang-il Park. Retrieved from https://idiyas.com/inventor/sang-il-park-df2m682i

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 18 

% Patents Active = 100.0

Average Co-Inventor Count = 3.1

ph-index = 4

Forward Citations = 43(Granted Patents)


Location History:

  • Sungnam, KR (2005)
  • Seongnam, KR (2009 - 2013)
  • Seongnam-si, KR (2017)
  • Gyeonggi-do, KR (2009 - 2021)
  • Suwon-si, KR (2023 - 2024)

Company Filing History:


Years Active: 2005-2025

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Areas of Expertise:
Atomic Force Microscope
Heat Distribution Measurement
Scanning Probe Microscope
Adaptive Scan Rate
Optical Measurement Device
Drift Compensation
Probe Replacement Function
Semiconductor Memory
Measurement Apparatus
Sample Position Identification
Chip Carrier Exchanging Device
Surface Measurement
18 patents (USPTO):Explore Patents

Title: **Innovations of Sang-il Park: A Pioneer in Measuring Techniques**

Introduction

Sang-il Park, an inventive mind hailing from Seongnam, Korea, has made significant contributions to the field of measurement technologies. With a remarkable portfolio of 17 patents, Park has developed groundbreaking methods and devices that enhance the precision of measuring heat distribution and identifying positions in atomic force microscopy.

Latest Patents

Among his latest innovations are two noteworthy patents. The first is a **measuring method for measuring heat distribution of a specific space using an SThM probe**. This method involves the linear movement of an SThM probe capable of measuring temperature changes in a designated area. By calculating heat distribution based on continuous temperature change values obtained during movement, this approach allows for detailed mapping of temperature distribution within small spaces.

The second patent is a **method and device for detecting the beam spot of a light source**. This invention complements the first by enabling accurate detection of a beam spot by utilizing the temperature distribution measured by the SThM probe. Together, these patents showcase Park's commitment to advancing measurement precision in scientific research.

Career Highlights

Sang-il Park has played a crucial role in developing innovative technologies during his tenure at prominent companies. He has worked with Park Systems Corporation, a leader in atomic force microscopy solutions, where he honed his skills in measurement techniques. Additionally, Park contributed to advancements at Psia Corporation, further solidifying his reputation in the field of precision measurement instruments.

Collaborations

Throughout his career, Park has collaborated with notable individuals such as Sang Han Chung and Byoung-Woon Ahn. These partnerships have fostered a productive environment for innovation and played a pivotal role in the development of his groundbreaking patents.

Conclusion

Sang-il Park stands as a prominent figure in the realm of measurement technologies. His innovative patents and collaborations highlight his contributions to scientific advancement. As the landscape of technology continues to evolve, Park's works will undoubtedly influence future developments in precision measurement principles and techniques.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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