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Suwon, South Korea

Park Systems Corporation

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USPTO Granted Patents = 23

EPO Patents = 4

Trademarks = 6

Forward Citations = 22

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45 inventors (with patents filed for the assignee):

Sang-il Park (14 out of 18 patents)

Byoung-Woon Ahn (6 out of 6 patents)

Ahjin Jo (5 out of 5 patents)

4. Sang Han Chung (5 out of 5 patents)

5. Ah Jin Jo (3 out of 3 patents)

6. Yong Kim (3 out of 104 patents)

7. Han Aul Noh (2 out of 2 patents)

8. Hyeong Chan Jo (2 out of 2 patents)

9. Hong Jae Lim (2 out of 2 patents)

10. Soobong Choi (2 out of 2 patents)

11. Seung Jun Shin (2 out of 2 patents)

12. Ju Suk Lee (2 out of 11 patents)

13. Joon Hui Kim (2 out of 2 patents)

14. Seung Hun Baik (2 out of 2 patents)

15. Matthias Duwe (2 out of 2 patents)

23 patents: Sort by Forward Citations

1. 12693309 - Method for obtaining characteristics of surface to be measured, by using inclined tip, atomic force microscope for performing method, and computer program stored in storage medium in order to perform method (2026-07-28),

2. 12693210 - Measurement system with detection mechanism and method of operation thereof (2026-07-28),

3. 12584942 - Measurement system with detection mechanism and method of operation thereof (2026-03-24),

4. 12584941 - Measurement system with detection mechanism and method of operation thereof (2026-03-24),

5. 12584866 - Measurement system with detection mechanism and method of operation thereof (2026-03-24),

6. 12449348 - Method of operating a polarization measuring device and polarization measuring device (2025-10-21),

7. 12399195 - Method for measuring, by measurement device, characteristics of surface of object to be measured, atomic force microscope for performing same method, and computer program stored in storage medium to perform same method (2025-08-26),

8. 12038455 - Measuring method for measuring heat distribution of specific space using SThM probe, method and device for detecting beam spot of light source (2024-07-16),

9. 11959852 - Method for determining properties of a sample by ellipsometry (2024-04-16),

10. 11761981 - Method and apparatus for identifying sample position in atomic force microscope (2023-09-19),

11. 11619649 - Atomic force microscope equipped with optical measurement device and method of acquiring information on surface of measurement target using the same (2023-04-04),

12. 11598788 - Measuring method for measuring heat distribution of specific space using SThM probe, method and device for detecting beam spot of light source (2023-03-07),

13. 11175308 - Chip carrier exchanging device and atomic force microscopy apparatus having same (2021-11-16),

14. 10133052 - Image acquiring method and image acquiring apparatus using the same (2018-11-20),

15. 9645169 - Measurement apparatus and method with adaptive scan rate (2017-05-09),

Company Overview

Park Systems Corporation is a leading provider of atomic force microscopy (AFM) solutions, specializing in high-resolution imaging and measurement technologies. The company focuses on advancing nanotechnology applications across various fields, including materials science, life sciences, and semiconductor research. With a commitment to innovation, Park Systems develops cutting-edge instruments that enhance research capabilities and drive scientific discovery, serving a global clientele from its headquarters in Suwon, South Korea.

Profile summary synthesized from public USPTO records and patent filings.

Company Badge

USPTO Data Jan 1 1976 - Oct 27 2026

23 Patents

#20 in Suwon

#574 in South Korea

#27,736 in the World

Suwon, South Korea

Park Systems Corporation

Forward Citations = 22

45 inventors:

Sang-il Park (14 out of 18 patents)

Byoung-Woon Ahn (6 out of 6 patents)

Ahjin Jo (5 out of 5 patents)

4. Sang Han Chung (5 out of 5 patents)

5. Ah Jin Jo (3 out of 3 patents)

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Park Systems Corporation. Retrieved from https://idiyas.com/company/park-systems

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]

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