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Suwon, South Korea

Park Systems Corporation

USPTO Granted Patents = 23

EPO Patents = 4

Trademarks = 6

Forward Citations = 21

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45 inventors (with patents filed for the assignee):

Sang-il Park (14 out of 18 patents)

Byoung-Woon Ahn (6 out of 6 patents)

Ahjin Jo (5 out of 5 patents)

4. Sang Han Chung (5 out of 5 patents)

5. Ah Jin Jo (3 out of 3 patents)

6. Yong Kim (3 out of 104 patents)

7. Han Aul Noh (2 out of 2 patents)

8. Hyeong Chan Jo (2 out of 2 patents)

9. Hong Jae Lim (2 out of 2 patents)

10. Soobong Choi (2 out of 2 patents)

11. Seung Jun Shin (2 out of 2 patents)

12. Ju Suk Lee (2 out of 11 patents)

13. Joon Hui Kim (2 out of 2 patents)

14. Seung Hun Baik (2 out of 2 patents)

15. Matthias Duwe (2 out of 2 patents)

23 patents: Sort by Forward Citations

1. 12693309 - Method for obtaining characteristics of surface to be measured, by using inclined tip, atomic force microscope for performing method, and computer program stored in storage medium in order to perform method (2026-07-28),

2. 12693210 - Measurement system with detection mechanism and method of operation thereof (2026-07-28),

3. 12584942 - Measurement system with detection mechanism and method of operation thereof (2026-03-24),

4. 12584941 - Measurement system with detection mechanism and method of operation thereof (2026-03-24),

5. 12584866 - Measurement system with detection mechanism and method of operation thereof (2026-03-24),

6. 12449348 - Method of operating a polarization measuring device and polarization measuring device (2025-10-21),

7. 12399195 - Method for measuring, by measurement device, characteristics of surface of object to be measured, atomic force microscope for performing same method, and computer program stored in storage medium to perform same method (2025-08-26),

8. 12038455 - Measuring method for measuring heat distribution of specific space using SThM probe, method and device for detecting beam spot of light source (2024-07-16),

9. 11959852 - Method for determining properties of a sample by ellipsometry (2024-04-16),

10. 11761981 - Method and apparatus for identifying sample position in atomic force microscope (2023-09-19),

11. 11619649 - Atomic force microscope equipped with optical measurement device and method of acquiring information on surface of measurement target using the same (2023-04-04),

12. 11598788 - Measuring method for measuring heat distribution of specific space using SThM probe, method and device for detecting beam spot of light source (2023-03-07),

13. 11175308 - Chip carrier exchanging device and atomic force microscopy apparatus having same (2021-11-16),

14. 10133052 - Image acquiring method and image acquiring apparatus using the same (2018-11-20),

15. 9645169 - Measurement apparatus and method with adaptive scan rate (2017-05-09),

PARK SYSTEMS CORPORATION is a leading provider of atomic force microscopy (AFM) solutions. With over 30 years of experience, PARK SYSTEMS has developed innovative AFM technologies and products to enable researchers and engineers across various industries to achieve breakthroughs in nanoscale science. The company's AFM solutions offer high-resolution imaging, accurate measurements, and advanced analysis capabilities, empowering scientists and engineers to study and manipulate materials at the atomic level. PARK SYSTEMS CORPORATION is committed to delivering cutting-edge AFM solutions and exceptional customer support to drive scientific advancements and technological innovations.

This text is generated by artificial intelligence and may not be accurate.

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USPTO Data Jan 1 1976 - Sep 15 2026

23 Patents

#19 in Suwon

#571 in South Korea

#27,581 in the World

Suwon, South Korea

Park Systems Corporation

Forward Citations = 21

45 inventors:

Sang-il Park (14 out of 18 patents)

Byoung-Woon Ahn (6 out of 6 patents)

Ahjin Jo (5 out of 5 patents)

4. Sang Han Chung (5 out of 5 patents)

5. Ah Jin Jo (3 out of 3 patents)

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