The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 28, 2026

Filed:

Jun. 16, 2025
Applicant:

Park Systems Corp., Suwon, KR;

Inventors:

Hyunsik Park, Suwon, KR;

Kyulee Kang, Suwon, KR;

Yoonshik Kang, Seongnam, KR;

Assignee:

Park Systems Corp., Suwon, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/21 (2006.01);
U.S. Cl.
CPC ...
G01N 21/211 (2013.01); G01N 2021/213 (2013.01);
Abstract

A method of operation of a measurement system includes: generating an encoded polarized light with a spatially-varying waveplate; generating an illumination line through a telecentric relay tilted under a condition; projecting the illumination line on a sample corresponding to a phase map carrying a different phase delay based on the encoded polarized light; and forming a line image of the illumination line with a linear detector array for testing the sample based on the line image.


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