The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 24, 2026

Filed:

Nov. 10, 2025
Applicant:

Park Systems Corp., Suwon, KR;

Inventors:

Hanaul Noh, Mountain View, CA (US);

Chih-Chieh Hsieh, San Jose, CA (US);

Myunghoon Choi, Santa Clara, CA (US);

Stefan Kaemmer, Santa Barbara, CA (US);

Assignee:

Park Systems Corp., Suwon, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 22/00 (2006.01); G01Q 60/38 (2010.01);
U.S. Cl.
CPC ...
G01N 22/00 (2013.01); G01Q 60/38 (2013.01);
Abstract

A method of operation of a measurement system includes: generating a microwave excitation to a sample; capturing a microwave response from the sample based on the microwave excitation; generating a baseband voltage based on the microwave response; determining a sense voltage based on the baseband voltage; generating an amplifier output voltage based on the sense voltage; and generating a channel output voltage based on the amplifier output voltage in a frequency range from a direct-current (DC) value to a predefined frequency value for characterizing the sample.


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