This inventor holds 3 USPTO granted patents. Top assignee: Park Systems Corporation. Active years: 2026.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2026
Title: Innovations by Chih-Chieh Hsieh
Introduction
Chih-Chieh Hsieh is a notable inventor based in San Jose, CA (US). He has made significant contributions to the field of measurement systems, holding a total of 3 patents. His work focuses on advanced methods of operation that enhance the characterization of samples through innovative technologies.
Latest Patents
Hsieh's latest patents include a measurement system with a detection mechanism and methods of operation. One of his patents describes a method that involves generating a microwave excitation to a sample, capturing a microwave response, and determining a sense voltage based on the baseband voltage. This process culminates in generating a channel output voltage that characterizes the sample across a frequency range from a direct-current (DC) value to a predefined frequency value. Another patent outlines a method where the sample is scanned along a path at different vertical positions, capturing microwave responses to determine voltage differences for characterization.
Career Highlights
Chih-Chieh Hsieh is currently employed at Park Systems Corporation, where he continues to innovate in measurement technologies. His work has been instrumental in advancing the capabilities of measurement systems, making them more efficient and effective.
Collaborations
Hsieh collaborates with talented coworkers, including Hanaul Noh and Myunghoon Choi. Their combined expertise contributes to the innovative environment at Park Systems Corporation.
Conclusion
Chih-Chieh Hsieh's contributions to measurement systems through his patents and collaborations highlight his role as a significant inventor in the field. His innovative methods continue to push the boundaries of technology and enhance the understanding of sample characterization.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile