The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 24, 2026
Filed:
Nov. 20, 2025
Park Systems Corp., Suwon, KR;
Hanaul Noh, Mountain View, CA (US);
Chih-Chieh Hsieh, San Jose, CA (US);
Myunghoon Choi, Santa Clara, CA (US);
Stefan Kaemmer, Santa Barbara, CA (US);
Park Systems Corp., Suwon, KR;
Abstract
A method of operation of a measurement system includes: capturing a probe measurement associated with a key, where the probe measurement is a first response or a second response based on a first microwave excitation or a second microwave excitation, respectively; generating a first channel voltage or a second channel voltage based on the first response or the second response, respectively; determining a phase offset based on the first channel voltage; storing the phase offset associated with the key; and calibrating the probe measurement by adjusting a phase based on computation of the second channel voltage with the phase offset accessed by the key.