The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 19, 2023
Filed:
Dec. 24, 2021
Applicant:
Park Systems Corp., Suwon-si, KR;
Inventors:
Assignee:
PARK SYSTEMS CORP., Suwon-si, KR;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01Q 30/02 (2010.01); G05B 13/02 (2006.01); G01Q 30/20 (2010.01); G01Q 60/24 (2010.01);
U.S. Cl.
CPC ...
G01Q 30/02 (2013.01); G01Q 30/20 (2013.01); G01Q 60/24 (2013.01); G05B 13/027 (2013.01);
Abstract
An apparatus and a method for identifying a sample position in an atomic force microscope according to an exemplary embodiment of the present disclosure are provided. The method for identifying a sample position in an atomic force microscope includes receiving a vision image including a subject sample through a vision unit; determining a subject sample region in the vision image using a prediction model which is configured to output the subject sample region by receiving the vision image as an input; and determining a position of the subject sample based on the subject sample region.