JeongHun An

Title: The Innovations of JeongHun An

Introduction

JeongHun An is a notable inventor based in Suwon-si, South Korea. He has made significant contributions to the field of atomic force microscopy, showcasing his expertise through his innovative patent.

Latest Patents

JeongHun An holds a patent for a "Method and apparatus for identifying sample position in atomic force microscope." This invention provides an apparatus and method for accurately identifying a sample position in an atomic force microscope. The method involves receiving a vision image that includes a subject sample through a vision unit. It also includes determining a subject sample region in the vision image using a prediction model, which outputs the subject sample region based on the vision image input. Finally, the position of the subject sample is determined based on the identified subject sample region.

Career Highlights

JeongHun An is currently employed at Park Systems Corporation, where he continues to advance his research and development in microscopy technologies. His work has contributed to enhancing the capabilities of atomic force microscopes, making them more efficient and precise.

Collaborations

JeongHun An has collaborated with notable colleagues, including YongSung Cho and Sang-il Park. Their combined efforts have fostered innovation and development within their field.

Conclusion

JeongHun An's contributions to atomic force microscopy through his patent and work at Park Systems Corporation highlight his role as an influential inventor. His innovative methods continue to shape the future of microscopy technology.