Sameer Chakravarthy Chillarige

Title: Sameer Chakravarthy Chillarige: Innovator in Integrated Circuit Testing

Introduction

Sameer Chakravarthy Chillarige is a notable inventor based in Uttar Pradesh, India. He has made significant contributions to the field of integrated circuit testing, holding a total of 10 patents. His innovative approaches have streamlined testing processes, reducing both time and costs associated with electronic device diagnostics.

Latest Patents

One of his latest patents is titled "Scan channel slicing for compression-mode testing of scan chains." This invention introduces methods and systems for testing scan chains in integrated circuits (ICs). By reducing the number of test cycles needed, it effectively enhances the efficiency of testing. The method involves loading and unloading data into scan chains while observing them, ensuring that all transitions are accounted for. This approach minimizes high-power patterns and allows for low-transition data to be utilized, which conserves dynamic power.

Another significant patent is the "System and method for multiple device diagnostics and failure grouping." This invention provides a diagnostic system that can assess multiple electronic devices based on specific selection criteria. It features a diagnosis engine that communicates with a failure database, allowing for the diagnosis of defects using previously grouped failure data. This innovation enhances the accuracy and efficiency of diagnosing electronic devices.

Career Highlights

Sameer currently works at Cadence Design Systems, Inc., where he continues to develop cutting-edge technologies in electronic design automation. His work has been instrumental in advancing the capabilities of integrated circuit testing and diagnostics.

Collaborations

Some of his notable coworkers include Anil Malik and Sharjinder Singh, who contribute to the innovative environment at Cadence Design Systems, Inc.

Conclusion

Sameer Chakravarthy Chillarige's contributions to integrated circuit testing through his patents demonstrate his commitment to innovation in the field. His work not only enhances testing efficiency but also paves the way for future advancements in electronic diagnostics.