The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 28, 2018
Filed:
May. 10, 2016
Applicant:
Cadence Design Systems, Inc., San Jose, CA (US);
Inventors:
Sharjinder Singh, Delhi, IN;
Sameer Chakravarthy Chillarige, Uttar Pradesh, IN;
Robert Jordan Asher, Endicott, NY (US);
Sonam Kathpalia, Uttar Pradesh, IN;
Patrick Wayne Gallagher, Apalachin, NY (US);
Joseph Michael Swenton, Owego, NY (US);
Assignee:
CADENCE DESIGN SYSTEMS, INC., San Jose, CA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/3173 (2006.01); G01R 31/317 (2006.01); G01R 31/3177 (2006.01); G01R 31/327 (2006.01);
U.S. Cl.
CPC ...
G01R 31/31703 (2013.01); G01R 31/3177 (2013.01); G01R 31/31704 (2013.01);
Abstract
Systems and methods disclosed herein provide for automatically diagnosing mis-compares detected during simulation of Automatic Test Pattern Generation ('ATPG') generated test patterns. Embodiments of the systems and methods provide for determining the origin of a mis-compare based on an analysis of the generated test patterns with a structural simulator and a behavioral simulator.