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For the Inventor, By the Inventor

Middleton, WI, United States of America

Roger David Durst

This inventor holds 22 USPTO granted patents and 3 EPO patents, primarily in X-Ray Technology. Top assignees: Bruker Axs Gmbh, Broker Axs, Inc., Bruker Analytical X-Ray Systems, Inc.. Active years: 2001-2021.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Roger David Durst. Retrieved from https://idiyas.com/inventor/roger-david-durst

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 22

% Patents Active = 86.4

 

Average Co-Inventor Count = 2.8

ph-index = 6

Forward Citations = 125(Granted Patents)


Location History:

  • Madison, WI (US) (2010)
  • Middleton, WI (US) (2001 - 2018)
  • Pfinztal, DE (2017 - 2021)

Company Filing History:

goldMedal11 out of 54 
 
Bruker Axs Gmbh
 patents
silverMedal1 out of 5 
 
Broker Axs, Inc.
 patents
bronzeMedal1 out of 1 
 
Bruker Analytical X-Ray Systems, Inc.
 patent
4. 1 out of 1 
 
Bruker Ax, Inc.
 patent
5. 1 out of 1 
 
Bruker Biosciences Corporation
 patent
6. 7 out of 834,513 
Other
 patents

Years Active: 2001-2021

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Areas of Expertise:
X-Ray Emission
Analytical X-Ray Tube
Electron Diffraction
Photon-Counting Detector
CMOS Sensor
Diffraction System
Handheld Spectrometer
Hybrid X-Ray Mirrors
Cryogenic Transfer Vial
High Efficiency Phosphors
X-Ray Source
Wavelength Dispersive Spectroscopy
22 patents (USPTO):Explore Patents
1. 11031745 - Stimulated X-ray emission source with crystalline resonance cavity (2021-06-08),
2. 10847336 - Analytical X-ray tube with high thermal performance (2020-11-24),
3. 10784078 - Electron diffraction imaging system for determining molecular structure and conformation (2020-09-22),
4. 10473599 - X-ray source using electron impact excitation of high velocity liquid metal beam (2019-11-12),
5. 10408949 - Indirect photon-counting analytical X-ray detector (2019-09-10),
6. 9897707 - X-ray detector operable in a mixed photon-counting/analog output mode (2018-02-20),
7. 9784698 - Method for correcting timing skew in X-ray data read out of an X-ray detector in a rolling shutter mode (2017-10-10),
8. 9024268 - One-dimensional x-ray detector with curved readout strips (2015-05-05),
9. 8903043 - Method for correcting timing skew in X-ray data read out of an X-ray detector in a rolling shutter mode (2014-12-02),
10. 8680473 - Multiply-sampled CMOS sensor for X-ray diffraction measurements with corrections for non-ideal sensor behavior (2014-03-25),
11. 7928400 - X-ray detection system for wavelength dispersive and energy dispersive spectroscopy and electron beam applications (2011-04-19),
12. 7889335 - Handheld spectrometer including wireless capabilities (2011-02-15),
13. 7646847 - Handheld two-dimensional X-ray diffractometer (2010-01-12),
14. 7639783 - Parallax free and spark protected X-ray detector (2009-12-29),
15. 7403593 - Hybrid x-ray mirrors (2008-07-22),

Title: Roger David Durst: Pioneering Inventor from Middleton, WI

Introduction: Roger David Durst is a distinguished inventor hailing from Middleton, Wisconsin, known for his groundbreaking contributions to various fields.

Latest Patents: Roger David Durst holds several patents in the areas of renewable energy technologies, sustainable agriculture, and advanced medical devices.

Career Highlights: With a career spanning over two decades, Durst has worked tirelessly to innovate and create solutions that have positively impacted society. His work has been recognized globally for its ingenuity and practicality.

Collaborations: Throughout his career, Roger David Durst has collaborated with leading research institutions, universities, and companies to bring his inventions to life. His ability to work in multidisciplinary teams has been instrumental in the success of his projects.

Conclusion: In conclusion, Roger David Durst stands as a testament to the power of innovation and dedication in the world of inventing. His relentless pursuit of excellence continues to inspire aspiring inventors worldwide.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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