The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 19, 2011
Filed:
Aug. 04, 2008
Yacouba Diawara, Madison, WI (US);
Roger D. Durst, Middleton, WI (US);
Sergei A. Medved, Madison, WI (US);
Vladislav N. Sedov, Fitchburg, WI (US);
Donald P. Lesher, Warren, OH (US);
Yacouba Diawara, Madison, WI (US);
Roger D. Durst, Middleton, WI (US);
Sergei A. Medved, Madison, WI (US);
Vladislav N. Sedov, Fitchburg, WI (US);
Donald P. Lesher, Warren, OH (US);
Bruker AXS, Inc., Madison, WI (US);
Abstract
A detection system for wavelength-dispersive and energy-dispersive spectrometry comprises an X-ray detector formed from a solid-state avalanche photodiode with a thin entrance window electrode that permits the efficient detection of X-rays scattered from 'light' elements. The detector can be tilted relative to the incident X-rays in order to increase the detection efficiency for X-rays scattered from 'heavy' elements. The entrance window may be continuous conductive layer with a thickness in the range of 5 to 10 nanometers or may be a pattern of conductive lines with “windowless” areas between the lines. A signal processing circuit for the avalanche photodiode detector includes an ultra-low noise amplifier, a dual channel discriminator, a scaler and a digital counter. A linear array of avalanche photodiode detectors is used to increase the count rate of the detection system.