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Madison, WI, United States of America

Bruker Axs Gmbh

USPTO Granted Patents = 54

% Expired Patents = 25.9

EPO Patents = 54

Trademarks = 2

Forward Citations = 327

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73 inventors (with patents filed for the assignee):

Bob Baoping He (12 out of 21 patents)

Roger David Durst (11 out of 22 patents)

Joachim Lange (5 out of 5 patents)

4. Norbert Kuhnmuench (4 out of 4 patents)

5. Christoph Ollinger (3 out of 9 patents)

6. Detlef Bahr (3 out of 4 patents)

7. Yacouba Diawara (3 out of 7 patents)

8. Peter Laggner (3 out of 3 patents)

9. Bruce L Becker (3 out of 3 patents)

10. Lutz Bruegemann (3 out of 3 patents)

11. Joerg Kaercher (2 out of 8 patents)

12. Gregory A Wachter (2 out of 4 patents)

13. Assunta Vigliante (2 out of 2 patents)

14. Sergei A Medved (2 out of 2 patents)

15. Rolf Schipper (2 out of 4 patents)

Core Competencies:

X-Ray Diffraction

XRF Measurement

Spectrometer

X-Ray Detector

Crystallographic Phases

Induction Furnaces

Beam Scattering

Optical Configuration

Sample Alignment

Combustion Analysis

Granulate Analysis

Raman Spectroscopy

54 patents: Sort by Forward Citations

1. 11933748 - Method of determining the three-dimensional structure of molecules in crystalline inclusion complexes (2024-03-19),

2. 10049850 - X-ray apparatus with deflectable electron beam (2018-08-14),

3. 10048126 - Optical base body for a spectrometer, method for producing an optical base body for a spectrometer and spectrometer comprising such optical base body (2018-08-14),

4. 9958404 - X-ray analyzing system for x-ray scattering analysis (2018-05-01),

5. 9945823 - Device and method for combustion analysis by means of induction furnaces and protective element for induction furnaces for the combustion analysis (2018-04-17),

6. 9541511 - XRF measurement apparatus for detecting contaminations on the bevel of a wafer (2017-01-10),

7. 9164047 - Apparatus and method for supporting a liquid sample for measuring scattering of electromagnetic radiation (2015-10-20),

8. 9024268 - One-dimensional x-ray detector with curved readout strips (2015-05-05),

9. 9008273 - System for analyzing a granulate for producing a pharmaceutical product (2015-04-14),

10. 8903043 - Method for correcting timing skew in X-ray data read out of an X-ray detector in a rolling shutter mode (2014-12-02),

11. 8867704 - Method for X-ray diffractometry analysis at differing wavelengths without exchanging the X-ray source (2014-10-21),

12. 8848870 - Point-line converter (2014-09-30),

13. 8680473 - Multiply-sampled CMOS sensor for X-ray diffraction measurements with corrections for non-ideal sensor behavior (2014-03-25),

14. 8548123 - Method and apparatus for using an area X-ray detector as a point detector in an X-ray diffractometer (2013-10-01),

15. 8520802 - Method for determining the quantitative composition of a powder sample (2013-08-27),

Bruker AXS GmbH, located in Madison, WI, specializes in advanced X-ray analysis technologies. The company develops and manufactures high-performance instruments for X-ray diffraction and X-ray fluorescence measurement, catering to a diverse range of applications in materials science, chemistry, and life sciences. Their innovative solutions include spectrometers and X-ray detectors, enabling precise analysis of crystallographic phases and material properties. Bruker AXS is committed to advancing research and industrial applications through cutting-edge technology in beam scattering and optical configurations.

Profile summary based on public USPTO records.

Company Badge

USPTO Data Jan 1 1976 - Sep 29 2026

Bruker Axs Gmbh

54 Patents

#19 in Madison, WI

#165 in Wisconsin

#6,549 in US

#13,100 in the World

Madison, WI, United States of America

Bruker Axs Gmbh

Forward Citations = 327

73 inventors:

Bob Baoping He (12 out of 21 patents)

Roger David Durst (11 out of 22 patents)

Joachim Lange (5 out of 5 patents)

4. Norbert Kuhnmuench (4 out of 4 patents)

5. Christoph Ollinger (3 out of 9 patents)

Please report any incorrect information to [email protected]

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