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Karlsruhe, Germany

Bruker Axs Gmbh

USPTO Granted Patents = 54

EPO Patents = 54

Trademarks = 2

Forward Citations = 317

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74 inventors (with patents filed for the assignee):

Bob Baoping He (12 out of 21 patents)

Roger David Durst (11 out of 22 patents)

Joachim Lange (5 out of 5 patents)

4. Norbert Kuhnmuench (4 out of 4 patents)

5. Christoph Ollinger (3 out of 8 patents)

6. Detlef Bahr (3 out of 4 patents)

7. Yacouba Diawara (3 out of 6 patents)

8. Peter Laggner (3 out of 3 patents)

9. Bruce L Becker (3 out of 3 patents)

10. Lutz Bruegemann (3 out of 3 patents)

11. Joerg Kaercher (2 out of 8 patents)

12. Gregory A Wachter (2 out of 4 patents)

13. Assunta Vigliante (2 out of 2 patents)

14. Sergei A Medved (2 out of 2 patents)

15. Rolf Schipper (2 out of 4 patents)

Core Competencies:

X-Ray Diffraction

Spectrometer Technology

X-Ray Analysis

Crystallography

Induction Furnaces

XRF Measurement

Electromagnetic Radiation Scattering

X-Ray Detection Systems

High-Intensity X-Ray Beams

Sample Alignment Mechanism

Hybrid X-Ray Mirrors

Combinatorial Screening

54 patents: Sort by Forward Citations

1. 11933748 - Method of determining the three-dimensional structure of molecules in crystalline inclusion complexes (2024-03-19),

2. 10049850 - X-ray apparatus with deflectable electron beam (2018-08-14),

3. 10048126 - Optical base body for a spectrometer, method for producing an optical base body for a spectrometer and spectrometer comprising such optical base body (2018-08-14),

4. 9958404 - X-ray analyzing system for x-ray scattering analysis (2018-05-01),

5. 9945823 - Device and method for combustion analysis by means of induction furnaces and protective element for induction furnaces for the combustion analysis (2018-04-17),

6. 9541511 - XRF measurement apparatus for detecting contaminations on the bevel of a wafer (2017-01-10),

7. 9164047 - Apparatus and method for supporting a liquid sample for measuring scattering of electromagnetic radiation (2015-10-20),

8. 9024268 - One-dimensional x-ray detector with curved readout strips (2015-05-05),

9. 9008273 - System for analyzing a granulate for producing a pharmaceutical product (2015-04-14),

10. 8903043 - Method for correcting timing skew in X-ray data read out of an X-ray detector in a rolling shutter mode (2014-12-02),

11. 8867704 - Method for X-ray diffractometry analysis at differing wavelengths without exchanging the X-ray source (2014-10-21),

12. 8848870 - Point-line converter (2014-09-30),

13. 8680473 - Multiply-sampled CMOS sensor for X-ray diffraction measurements with corrections for non-ideal sensor behavior (2014-03-25),

14. 8548123 - Method and apparatus for using an area X-ray detector as a point detector in an X-ray diffractometer (2013-10-01),

15. 8520802 - Method for determining the quantitative composition of a powder sample (2013-08-27),

BRUKER AXS GMBH is a leading global provider of advanced analytical solutions for materials research and development. With a diverse portfolio of innovative technologies, including X-ray diffraction (XRD), X-ray fluorescence (XRF), and atomic force microscopy (AFM), BRUKER AXS GMBH helps scientists and engineers in various industries gain insights into the structure, composition, and properties of materials. Their state-of-the-art instruments enable precise measurements and analysis for applications such as pharmaceuticals, chemicals, nanotechnology, materials science, and many more.

This text is generated by artificial intelligence and may not be accurate.

Company Badge

USPTO Data Jan 1 1976 - Dec 30 2025

54 Patents

#5 in Karlsruhe

#1,016 in Germany

#12,743 in the World

Karlsruhe, Germany

Bruker Axs Gmbh

Forward Citations = 317

74 inventors:

Bob Baoping He (12 out of 21 patents)

Roger David Durst (11 out of 22 patents)

Joachim Lange (5 out of 5 patents)

4. Norbert Kuhnmuench (4 out of 4 patents)

5. Christoph Ollinger (3 out of 8 patents)

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