The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 20, 2015

Filed:

Oct. 06, 2011
Applicants:

Heinz Amenitsch, Graz, AT;

Benedetta Marmiroli, Modena, IT;

Peter Laggner, Graz, AT;

Inventors:

Heinz Amenitsch, Graz, AT;

Benedetta Marmiroli, Modena, IT;

Peter Laggner, Graz, AT;

Assignee:

Bruker AXS GmbH, Karlsruhe, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 23/201 (2006.01); H05G 1/00 (2006.01); G01N 23/20 (2006.01); G01N 21/51 (2006.01); G01N 23/22 (2006.01);
U.S. Cl.
CPC ...
G01N 23/20025 (2013.01); G01N 21/51 (2013.01); G01N 23/2204 (2013.01);
Abstract

An apparatus for supporting a liquid sample for measuring an intensity of X-ray radiation scattered by the liquid sample is configured such as to allow the X-ray radiation to impinge along a first direction () through the first support member onto the liquid sample and to leave the liquid sample through the second member along a second direction () different from the first direction to be detected by a detector. Further, a system for measuring an intensity of X-ray radiation scattered by a liquid sample and corresponding methods are provided.


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