The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 01, 2018
Filed:
Mar. 06, 2014
Bruker Axs Gmbh, Karlsruhe, DE;
Jan Skov Pedersen, Aarhus, DK;
Bruker AXS GmbH, Karlsruho, DE;
Abstract
An X-ray analyzing system for x-ray scattering analysis having an x-ray source for generating a beam of x-rays propagating along a transmission axis (), at least one hybrid slit () with an aperture which defines the shape of the cross section of the beam, a sample on which the beam shaped by the hybrid slit () is directed and an X-ray detector for detecting x-rays originating from the sample. The hybrid slit () has at least three hybrid slit elements (), each hybrid slit element () having a single crystal substrate () bonded to a base () with a taper angle α≠0. The single crystal substrates () of the hybrid slit elements () limit the aperture and the hybrid slit elements () are staggered with an offset along the transmission axis (). The X-ray analyzing system has improved resolution and signal to noise ratio.