This inventor holds 1 USPTO granted patent and 1 EPO patent. Top assignee: Bruker Axs Gmbh. Active years: 2018.
Company Filing History:
Years Active: 2018
Title: Jan Skov Pedersen: Innovator in X-ray Analyzing Systems
Introduction
Jan Skov Pedersen is a notable inventor based in Aarhus, Denmark. He has made significant contributions to the field of X-ray technology, particularly in the development of systems for X-ray scattering analysis. His innovative work has led to advancements that enhance the resolution and signal-to-noise ratio in X-ray analysis.
Latest Patents
Jan Skov Pedersen holds a patent for an X-ray analyzing system designed for X-ray scattering analysis. This system includes an X-ray source that generates a beam of X-rays propagating along a transmission axis. It features at least one hybrid slit with an aperture that defines the shape of the beam's cross-section. The system directs the beam onto a sample and utilizes an X-ray detector to capture X-rays originating from that sample. The hybrid slit consists of at least three hybrid slit elements, each with a single crystal substrate bonded to a base, ensuring improved performance in X-ray analysis.
Career Highlights
Jan Skov Pedersen is associated with Bruker AXS GmbH, a company known for its advanced analytical instruments and solutions. His work at Bruker AXS GmbH has allowed him to contribute to the development of cutting-edge technologies in the field of X-ray analysis.
Collaborations
Due to space constraints, the collaborations section will be omitted.
Conclusion
Jan Skov Pedersen's innovative contributions to X-ray analyzing systems exemplify the impact of his work in enhancing analytical techniques. His patent reflects a commitment to advancing technology in the field, making significant strides in X-ray scattering analysis.