Rolf Schipper

Title: Rolf Schipper: Innovator in X-ray Technology

Introduction

Rolf Schipper is a notable inventor based in Karlsruhe, Germany. He has made significant contributions to the field of X-ray technology, holding a total of four patents. His innovative methods have advanced the capabilities of X-ray analysis, particularly in the study of crystalline and amorphous materials.

Latest Patents

One of Schipper's latest patents is a method for X-ray diffractometry analysis at differing wavelengths without exchanging the X-ray source. This method allows for the analysis of samples using an optical X-ray apparatus with a mixed metal anode, enabling simultaneous acquisition of X-rays with different characteristic energy lines during an angle scan. Another significant patent is the vertical small angle X-ray scattering system, which simplifies the analysis of liquid samples. This system features a vertical orientation and allows for both beam-up and beam-down configurations, enhancing the efficiency of X-ray scattering analysis.

Career Highlights

Throughout his career, Rolf Schipper has worked with prominent companies in the field, including Bruker AXS GmbH and Bruker AXS Analytical X-ray Systems GmbH. His work has been instrumental in developing advanced X-ray technologies that are widely used in research and industry.

Collaborations

Schipper has collaborated with notable professionals in his field, including Juergen Fink and Kingsley Smith. These collaborations have contributed to the advancement of X-ray technology and the successful development of innovative solutions.

Conclusion

Rolf Schipper's contributions to X-ray technology through his patents and collaborations highlight his role as a leading inventor in this field. His innovative methods continue to influence the way X-ray analysis is conducted, paving the way for future advancements.