The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 25, 1994
Filed:
Aug. 10, 1993
Juergen Fink, Elcheshein-Illingen, DE;
Rolf Schipper, Karlsruhe, DE;
Kingsley Smith, Madison, WI (US);
Richard Ortega, Madison, WI (US);
Siemens Industrial Automation, Inc., Alpharetta, GA (US);
Abstract
An X-ray diffractometer having a simple yet accurate means for locating the surface of the sample to be examined with respect to the zero point of the X-ray (RS) is disclosed. Briefly stated, a laser (LA) and camera (KA) are positioned at preferably 90.degree. with respect to each other such that the intersection of the optical axis of the camera and the laser passes through the zero point of the diffractometer. In this fashion, the camera will see at its center, the zero point of the X-ray despite the fact that the X-ray is of course invisible to the naked eye. Accordingly, by movement of the sample (P) with respect to this camera image, the true and correct zero point of the X-ray with respect to the surface of the sample to be examined may be determined without the need for experimental and unnecessary X-ray or examination runs being taken.