This inventor holds 1 USPTO granted patent. Top assignee: Siemens Industrial Automation, Inc.. Active years: 1994.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 1994
Title: Richard Ortega - Innovator in X-ray Technology
Introduction
Richard Ortega is a notable inventor based in Madison, WI (US). He has made significant contributions to the field of X-ray technology, particularly with his innovative patent for an X-ray micro diffractometer sample positioner. His work has implications for improving the accuracy and efficiency of X-ray examinations.
Latest Patents
Richard Ortega holds a patent for an X-ray micro diffractometer sample positioner. This invention provides a simple yet accurate means for locating the surface of the sample to be examined with respect to the zero point of the X-ray. The design incorporates a laser and camera positioned at 90 degrees to each other, allowing the camera to visualize the zero point of the X-ray, which is otherwise invisible. This advancement enables the determination of the true zero point of the X-ray concerning the sample surface without the need for unnecessary experimental runs.
Career Highlights
Richard Ortega is currently employed at Siemens Industrial Automation, Inc., where he continues to develop innovative solutions in industrial automation and X-ray technology. His expertise and dedication to his work have made him a valuable asset to his team.
Collaborations
Richard has collaborated with esteemed colleagues such as Juergen Fink and Rolf Schipper, contributing to various projects that enhance the capabilities of X-ray technology.
Conclusion
Richard Ortega's contributions to the field of X-ray technology through his innovative patent demonstrate his commitment to advancing scientific research and industrial applications. His work continues to influence the way X-ray examinations are conducted, paving the way for more accurate and efficient methodologies.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile