The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 14, 2018
Filed:
Sep. 01, 2015
Bruker Axs Gmbh, Karlsruhe, DE;
Christoph Ollinger, Karlsruhe, DE;
Carsten Michaelsen, Artlenburg, DE;
Andreas Kleine, Hamburg, DE;
Juergen Graf, Rosengarten, DE;
Bruker AXS GmbH, Karlsruhe, DE;
Abstract
An x-ray apparatus (), has an electron beam source (), a target (), onto which the electron beam () is directed to form a focal spot () on the target (), x-ray optics () for collecting x-rays emitted from the focal spot () to form an x-ray beam () and a sample position () at which the x-ray beam () is directed. The x-ray apparatus () further includes an electrostatic or electromagnetic electron beam deflection device () suitable for moving the focal spot () on the target (). The extension of the focal spot () in any direction (x, y, z) is at least a factor of 1.5 smaller than the extension of the target (). An x-ray apparatus is thereby provided with simplified alignment of the x-ray optics with respect to a microfocus x-ray source.