The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 02, 2014
Filed:
Oct. 24, 2011
Roger D Durst, Middleton, WI (US);
Joerg Kaercher, Madison, WI (US);
Gregory a Wachter, Sun Prairie, WI (US);
John L Chambers, Jr., Woodville, OH (US);
Roger D Durst, Middleton, WI (US);
Joerg Kaercher, Madison, WI (US);
Gregory A Wachter, Sun Prairie, WI (US);
John L Chambers, Jr., Woodville, OH (US);
Bruker AXS, Inc., Madison, WI (US);
Abstract
In an X-ray detector operating in a rolling shutter read out mode, by precisely synchronizing sample rotation with the detector readout, the effects of timing skew on the image intensities and angular positions caused by the rolling shutter read out can be compensated by interpolation or calculation, thus allowing the data to be accurately integrated with conventional software. In one embodiment, the reflection intensities are interpolated with respect to time to recreate data that is synchronized to a predetermined time. This interpolated data can then be processed by any conventional integration routine to generate a 3D model of the sample. In another embodiment a 3D integration routine is specially adapted to allow the time-skewed data to be processed directly and generate a 3D model of the sample.