The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 12, 2010
Filed:
May. 01, 2008
Bob B. He, Madison, WI (US);
Roger D. Durst, Madison, WI (US);
Bob B. He, Madison, WI (US);
Roger D. Durst, Madison, WI (US);
Bruker AXS Inc., Madison, WI (US);
Abstract
A handheld X-ray diffractometer comprises a miniaturized X-ray source and multiple area detectors to allow the diffractometer to obtain two-dimensional X-ray diffraction images in a large diffraction space without rotating the sample. The source and detectors are located inside of a radio opaque enclosure that protects the operator during use. The handheld diffractometer also comprises a sample monitoring and alignment system that allows an operator to observe the measuring area and to align the diffractometer to the sample from outside of the housing. A specially designed mouthpiece, which mates the diffractometer to the sample area, prevents x-ray leakage and triggers off the data collection. The detectors can be positioned to perform measurements necessary to calculate a mechanical stress in the sample. Linear detectors may also be used in place of the area detectors.