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Forward Citations = 42

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10 inventors (with patents filed for the assignee):

Bob Baoping He (3 out of 21 patents)

Arne Kasten (1 out of 33 patents)

Carsten Michaelsen (1 out of 13 patents)

4. Gerald T Schwarz (1 out of 1 patent)

5. Arjen B Storm (1 out of 3 patents)

6. Leendert J Seijbel (1 out of 3 patents)

7. Gijsbertus J Kerpershoek (1 out of 2 patents)

8. Chuji Katayama (1 out of 1 patent)

9. Roger David Durst (1 out of 22 patents)

10. Fabian Nitsche (1 out of 2 patents)

5 patents: Sort by Forward Citations

1. 11678803 - System and method for improved measurement of peak intensities in pulse height spectra obtained by wave-length dispersive x-ray fluorescence spectrometers (2023-06-20),

2. 7848489 - X-ray diffractometer having co-exiting stages optimized for single crystal and bulk diffraction (2010-12-07),

3. 7386097 - Analytical instrument with variable apertures for radiation beam (2008-06-10),

4. 7317784 - Multiple wavelength X-ray source (2008-01-08),

5. 7190762 - Scanning line detector for two-dimensional x-ray diffractometer (2007-03-13),

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