The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 10, 2008
Filed:
Oct. 25, 2005
Gijsbertus J. Kerpershoek, Barendrecht, NL;
Leendert J. Seijbel, Rotterdam, NL;
Arjen B. Storm, Den Haag, NL;
Arne Kasten, Karlsruhe, DE;
Gijsbertus J. Kerpershoek, Barendrecht, NL;
Leendert J. Seijbel, Rotterdam, NL;
Arjen B. Storm, Den Haag, NL;
Arne Kasten, Karlsruhe, DE;
Broker AXS, Inc., Madison, WI (US);
Abstract
An X-ray analysis device makes use of a variable aperture for controlling the position and cross section of the X-ray beam. The variable aperture is configured to allow changes in the cross section and/or position of the beam by movement of one aperture component in one direction. In one embodiment, the aperture medium is a perforated disk that is rotated to expose different aperture holes to the beam. In another embodiment, the aperture medium is a perforated tape that is moved in a linear direction to expose different aperture holes to the beam. The tape may be wound about two axes to control its movement, or may be a continuous loop. A cassette may also be used to house the tape.