The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 20, 2023
Filed:
Jan. 27, 2023
Bruker Axs Gmbh, Karlsruhe, DE;
Fabian Nitsche, Wörth am Rhein, DE;
Broker AXS GmbH, Karlsruhe, DE;
Abstract
Techniques for estimating peak intensities in pulse height spectra obtained by a wave-length dispersive x-ray fluorescence spectrometer are disclosed. A pulse height spectrum is obtained from a sample. A model generator generates a pulse height spectrum model by creating a plurality of diffraction order profiles with predefined profile shapes at photon energy positions corresponding to respective diffraction orders of a monochromator of a spectrometer. For each created diffraction order profile where the corresponding photon energy is higher than the edge energy of the detector material of the detector, a respective escape profile is added. A model adjustment module adjusts pulse-height-to-energy-mapping parameters and contribution area of each diffraction order profile ensemble of the pulse height spectrum model using a fitting algorithm. An intensity module provides the contribution area of the first order profile ensemble as the intensity of the energy to be determined by the wavelength-dispersive X-ray fluorescence spectrometer.