The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 15, 2011
Filed:
Jul. 17, 2008
Roger David Durst, Middleton, WI (US);
John Hooper Landefeld, Kennewick, WA (US);
Jeremy Lea, Congleton, GB;
Larry Stephen Price, Richland, WA (US);
Roger David Durst, Middleton, WI (US);
John Hooper Landefeld, Kennewick, WA (US);
Jeremy Lea, Congleton, GB;
Larry Stephen Price, Richland, WA (US);
Bruker Biosciences Corporation, Billerica, MA (US);
Abstract
A method for collecting and analyzing spectrum data to identify a composition of a sample material is described. The method includes obtaining a sample material, receiving a geographical location of the sample material at a handheld instrument, and analyzing the sample material to obtain sample spectrum data using the handheld instrument. The method also includes determining whether to perform an analysis of the sample spectrum data using the handheld instrument, or to perform the analysis of the sample spectrum data using a remote computer. The method also includes determining a composition of the sample material based on an analysis of the sample spectrum data and recording in a memory area at least one of the composition and the geographical location of the sample material.