Bruker Axs Gmbh

Other

Broker Axs, Inc.

Bruker Biosciences Corporation

Bruker Analytical X-ray Systems, Inc.

Bruker Ax, Inc.

Roger David Durst

Bob Baoping He

Joerg Kaercher

Yacouba Diawara

Gregory A Wachter

Christoph Ollinger

Carsten Michaelsen

Bruce L Becker

Sergei A Medved

Peter Laggner

Larry Stephen Price

Juergen Graf

Menyhert Kocsis

John L Chambers

Tianqing He

Vladislav N Sedov

Jenss Schmidt-May

Donald P Lesher

John Hooper Landefeld

Jeremy Lea

Hao Jiang

Chuji Katayama

Max Li

Stephen I Foundling

Sean N Carney

Rudolph Shuvalov

Vello Valdna

Paul Radcliffe

Bob Boaping He

An X-ray laser has a target anode of a crystalline material that emits X-ray radiation in response to excitation and that is located on a thermally conductive substrate. An X-ray source provides an input X-ray beam that illuminates a predetermined volume of the target anode at a predefined angle relative to a surface of the anode so as to induce a Borrmann mode standing wave in the predetermined volume. An electron source outputs an electron beam that is incident on the Borrmann mode region so as to cause electron impact ionization of the crystalline material and thereby induce stimulated emission of a coherent output X-ray beam.

Stimulated X-ray emission source with crystalline resonance cavity

An analytical X-ray tube with an anode target material that emits characteristic X-rays in response to excitation by an electron beam may include any of several advantageous features. The target material is deposited on a diamond substrate layer, and a metal carbide intermediate layer may be provided between the target material and substrate that provides enhanced bonding therebetween. An interface layer may also be used that provides an acoustic impedance matching between the target material and the substrate. For a low thermal conductivity target material, a heat dissipation layer of a higher thermal conductivity material may also be included between the target material and substrate to enhance thermal transfer. The target material may have a thickness that corresponds to a maximum penetration depth of the electrons of the electron beam, and the structure may be such that a predetermined temperature range is maintained at the substrate interface.

Analytical X-ray tube with high thermal performance

An electron diffraction imaging system for imaging the three-dimensional structure of a single target molecule of a sample uses an electron source that emits a beam of electrons toward the sample, and a two-dimensional detector that detects electrons diffracted by the sample and generates an output indicative of their spatial distribution. A sample support is transparent to electrons in a region in which the sample is located, and is rotatable and translatable in at least two perpendicular directions. The electron beam has an operating energy between 5 keV and 30 keV, and beam optics block highly divergent electrons to limit the beam diameter to no more than three times the size of the sample molecule and provide a lateral coherence length of at least 15 nm. An adjustment system adjusts the sample support position in response to the detector output to center the target molecule in the beam.

Electron diffraction imaging system for determining molecular structure and conformation

An X-ray source uses excitation of a liquid metal beam of ions or ionized droplets to produce an X-ray output with higher brightness than conventional sources. The beam may be accelerated from a liquid metal source using an extraction electrode. The source may have an emitter tip, and the acceleration of the liquid metal may include field emission from a Taylor cone. An electrostatic or electromagnetic focusing electrode may be used to reduce a cross-sectional diameter of the beam. The liquid metal beam has a relatively high velocity as it does not suffer from flow turbulence, thus allowing for a more energetic excitation and a correspondingly higher brightness. A beam dump may also be used to collect the liquid metal beam after excitation, and may be concave with no direct sight lines to either an electron beam cathode or to X-ray windows of an enclosure for the source.

X-ray source using electron impact excitation of high velocity liquid metal beam

An indirect, photon-counting X-ray detector capable of detecting the low-energy X-rays includes a scintillator screen that is directly coupled to a two-dimensional optical sensor. A signal filter receives an electrical output signal from the optical sensor and removes high intensity signal contributions therefrom that are indicative of direct interaction between said X-ray signal and said optical sensor. The scintillator screen has a sufficient thickness to ensure a high absorption of incident X-ray photons, and uses phosphor grains with a relatively small grain size. A cooling apparatus in thermal communication with the optical sensor may be used to control its temperature. The signal filter maintains a running average of changes in measured pixel output values for consecutive measurements, and replaces a measured value caused by a direct interaction event with a value equal to a previous measured value plus said running average.

Indirect photon-counting analytical X-ray detector

A method for X-ray detection using a charge-integrating X-ray detector including a photodetector array of pixels, each of which converts incident radiation into accumulated charge during an X-ray exposure, is provided. The method includes, for each pixel, reading out the accumulated charge from the pixel and determining an X-ray charge value from the read out accumulated charge. If the X-ray charge value is less than a photon counting threshold, the X-ray charge value is replaced with a quantized charge value representative of an estimated photon count and recording the quantized charge value as a recorded charge value. If, however, the X-ray charge is equal to or greater than the photon counting threshold, the X-charge value is recorded as the recorded charge value. The method allows operating a charge-integrating X-ray detector in a mixed photon-counting/analog output mode.

X-ray detector operable in a mixed photon-counting/analog output mode

In an X-ray detector operating in a rolling shutter read out mode, by precisely synchronizing sample rotation with the detector readout, the effects of timing skew on the image intensities and angular positions caused by the rolling shutter read out can be compensated by interpolation or calculation, thus allowing the data to be accurately integrated with conventional software. In one embodiment, the reflection intensities are interpolated with respect to time to recreate data that is synchronized to a predetermined time. This interpolated data can then be processed by any conventional integration routine to generate a 3D model of the sample. In another embodiment a 3D integration routine is specially adapted to allow the time-skewed data to be processed directly and generate a 3D model of the sample.

Method for correcting timing skew in X-ray data read out of an X-ray detector in a rolling shutter mode

A detector for a small-angle x-ray diffraction system uses curved readout strips shaped to correspond to the expected intensity distribution of x-rays scattered by the system. This expected intensity distribution may be a series of concentric circles, and each of the strips has a shape that approximates a section of an annulus. The strips may be positioned on a substrate such that a center of curvature of the curved strips is located along an edge of a readout region within which the strips are located or, alternatively, at a geometric center of the readout region. The detector may have a signal readout system that uses a delay line or, alternatively, a multichannel readout system. The detector may make use of electron generation via interaction of the diffracted x-ray beam with a gas in a gas chamber, or through interaction of the diffracted beam with a semiconductor material.

One-dimensional x-ray detector with curved readout strips

Readout noise for each pixel in a CMOS Active Pixel Sensor is reduced by a five step process in which the pixel charge data from the sensor is non-destructively sampled at a plurality of times during a sensor frame time period and corrected for gain variation and nonlinearity. Then fixed pattern and dark current noise is estimated and subtracted from the corrected pixel charge data. Next, reset noise is estimated and subtracted from the pixel charge data. In step four, a model function of charge versus time is fit to the corrected pixel charge data samples. Finally, the fitted model function is evaluated at frame boundary times.

Multiply-sampled CMOS sensor for X-ray diffraction measurements with corrections for non-ideal sensor behavior

A detection system for wavelength-dispersive and energy-dispersive spectrometry comprises an X-ray detector formed from a solid-state avalanche photodiode with a thin entrance window electrode that permits the efficient detection of X-rays scattered from 'light' elements. The detector can be tilted relative to the incident X-rays in order to increase the detection efficiency for X-rays scattered from 'heavy' elements. The entrance window may be continuous conductive layer with a thickness in the range of 5 to 10 nanometers or may be a pattern of conductive lines with &#x201c;windowless&#x201d; areas between the lines. A signal processing circuit for the avalanche photodiode detector includes an ultra-low noise amplifier, a dual channel discriminator, a scaler and a digital counter. A linear array of avalanche photodiode detectors is used to increase the count rate of the detection system.

X-ray detection system for wavelength dispersive and energy dispersive spectroscopy and electron beam applications

A method for collecting and analyzing spectrum data to identify a composition of a sample material is described. The method includes obtaining a sample material, receiving a geographical location of the sample material at a handheld instrument, and analyzing the sample material to obtain sample spectrum data using the handheld instrument. The method also includes determining whether to perform an analysis of the sample spectrum data using the handheld instrument, or to perform the analysis of the sample spectrum data using a remote computer. The method also includes determining a composition of the sample material based on an analysis of the sample spectrum data and recording in a memory area at least one of the composition and the geographical location of the sample material.

Handheld spectrometer including wireless capabilities

A handheld X-ray diffractometer comprises a miniaturized X-ray source and multiple area detectors to allow the diffractometer to obtain two-dimensional X-ray diffraction images in a large diffraction space without rotating the sample. The source and detectors are located inside of a radio opaque enclosure that protects the operator during use. The handheld diffractometer also comprises a sample monitoring and alignment system that allows an operator to observe the measuring area and to align the diffractometer to the sample from outside of the housing. A specially designed mouthpiece, which mates the diffractometer to the sample area, prevents x-ray leakage and triggers off the data collection. The detectors can be positioned to perform measurements necessary to calculate a mechanical stress in the sample. Linear detectors may also be used in place of the area detectors.

Handheld two-dimensional X-ray diffractometer

An X-ray detector is formed with a geometry in the form of a spherical polygon, including an entrance window, a grid and an anode. The spherical polygonal entrance window and the grid form a spherical polygonal drift region between them. The electric field in this region is radial and eliminates parallax broadening. A spherical polygonal amplification region between a resistive anode on an insulating support and the grid allows very high gas amplification and good protection against spark discharges. A readout electrode on the back side of the anode insulator detects induced charges and protects the readout electronics against sparks.

Parallax free and spark protected X-ray detector

An x-ray mirror provides focusing and monochromatization while maintaining a high degree of reflectivity. The mirror has at least two mirror portions, one with a multilayer surface that provides the desired monochromating, and the other with a total external reflection surface. The multiple surfaces combine to provide the desired focusing of the x-rays from a source to a focus point. A variety of configurations may be used, each of which does the desired focusing and monochromatization with minimal energy loss. Relative positioning of the mirror portions may also allow for adjustment of the focus length.

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Middleton, WI, United States of America

Roger David Durst