Fairfax, VT, United States of America

Roger Aime Dufresne

USPTO Granted Patents = 12 

Average Co-Inventor Count = 4.1

ph-index = 2

Forward Citations = 26(Granted Patents)


Location History:

  • Essex Junction, VT (US) (2014)
  • Fairfax, VT (US) (1999 - 2018)

Company Filing History:


Years Active: 1999-2018

where 'Filed Patents' based on already Granted Patents

12 patents (USPTO):

Title: Roger Aime Dufresne: Innovator in Dielectric Testing

Introduction

Roger Aime Dufresne, an accomplished inventor based in Fairfax, Vermont, has made significant contributions in the field of dielectric reliability evaluations. With a total of 12 patents to his name, he has demonstrated his expertise and innovative spirit throughout his career.

Latest Patents

Among his latest inventions, Dufresne's patents include methods and test structures specifically designed for evaluating the reliability of dielectric materials. One notable patent details a test structure that features a first row of contacts and a conductor line, purposely spaced apart to maintain a minimum distance from these contacts. This innovative design also incorporates a second row of contacts, further enhancing the reliability assessment of dielectric materials.

Another significant patent pertains to via leakage and breakdown testing. This invention includes a comprehensive testing structure featuring multiple terminals coupled with sensing lines arranged in a comb formation. The design allows for effective electrical coupling between different levels of the structure through a plurality of vias, showcasing Dufresne's dedication to advancing testing methods in his field.

Career Highlights

Dufresne's career spans notable positions at leading technology entities, including International Business Machines Corporation (IBM) and Globalfoundries Inc. His work in these companies has not only broadened his professional experience but also added substantial value to the advancements in dielectric materials and testing methodologies.

Collaborations

Throughout his professional journey, Dufresne has collaborated with esteemed colleagues such as Fen Chen and Alvin Wayne Strong. These partnerships have contributed to the innovative projects he has undertaken and have enriched the collaborative nature of research and development in the industry.

Conclusion

Roger Aime Dufresne stands out as a prolific inventor whose work significantly impacts the field of dielectric reliability evaluations. With a proven track record of innovative patents and valuable collaborations, Dufresne continues to exemplify the spirit of innovation in technology.

This text is generated by artificial intelligence and may not be accurate.
Please report any incorrect information to support@idiyas.com
Loading…