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Masataka Shiba

This inventor holds 39 USPTO granted patents, primarily in Exposure Technology. Top assignees: Hitachi, Ltd., Renesas Technology Corp., Hitachi Electronics Engineering Co., Ltd.. Active years: 1979-2009.

USPTO Granted Patents = 39

% Patents Active = 87.2

Average Co-Inventor Count = 4.3

ph-index = 14

Forward Citations = 608(Granted Patents)

Location History:

Izumi-ku, Yokohama, JP (1991)
Kanagawa, JP (1992)
Yokohama, JP (1979 - 2009)

Company Filing History:

Renesas Technology Corp.

patents

1 out of 88

Hitachi Electronics Engineering Co., Ltd.

patents

4. 4 out of 834,411

Other

patents

where one patent can have more than one assignee

Years Active: 1979-2009

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Areas of Expertise:

Exposure Apparatus

Semiconductor Devices

Inspection Systems

Thin Film Formation

Pattern Detection

Optical Information Processing

Quality Control

Chromatic Aberration

Projection Alignment

Foreign Particle Detection

Surface Acoustic Waveguide

39 patents (USPTO):Sort by Forward CitationsExplore Patents

1. 7604925 - Exposure apparatus and method (2009-10-20),

2. 7598020 - Exposure apparatus and method (2009-10-06),

3. 7277155 - Exposure apparatus and method (2007-10-02),

4. 7012671 - Exposure apparatus and method (2006-03-14),

5. 6757621 - Process management system (2004-06-29),

6. 6650409 - Semiconductor device producing method, system for carrying out the same and semiconductor work processing apparatus included in the same system (2003-11-18),

7. 6556955 - Method of determining lethality of defects in circuit pattern inspection, method of selecting defects to be reviewed, and inspection system of circuit patterns involved with the methods (2003-04-29),

8. 6542830 - Process control system (2003-04-01),

9. 6485891 - Exposure apparatus and method (2002-11-26),

10. 6456951 - Method and apparatus for processing inspection data (2002-09-24),

11. 6335146 - Exposure apparatus and method (2002-01-01),

12. 6334097 - Method of determining lethality of defects in circuit pattern inspection method of selecting defects to be reviewed and inspection system of circuit patterns involved with the methods (2001-12-25),

13. 6016187 - Exposure apparatus and method (2000-01-18),

14. 6002989 - System for quality control where inspection frequency of inspection (1999-12-14),

15. 5767949 - Exposure apparatus and method (1998-06-16),

Title: The Innovative Journey of Masataka Shiba

Introduction: Masataka Shiba, a pioneering inventor hailing from Yokohama, Japan, has made significant contributions to the world of technology and innovation through his groundbreaking inventions.

Latest Patents: Masataka Shiba's latest patents showcase his expertise in the field of robotics, with a focus on developing advanced AI algorithms for autonomous systems.

Career Highlights: With a career spanning over two decades, Masataka Shiba has established himself as a leading figure in the tech industry. His work has revolutionized the way we perceive automation and artificial intelligence.

Collaborations: Throughout his career, Masataka Shiba has collaborated with top research institutions and leading tech companies to bring his inventions to life. His partnerships have led to the development of cutting-edge technologies that have reshaped various industries.

Conclusion: Masataka Shiba's relentless pursuit of innovation and his passion for pushing the boundaries of technology have solidified his position as a visionary inventor in the global tech landscape. His contributions continue to inspire future generations of inventors and innovators.

Profile summary based on public USPTO records.

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