San Jose, CA, United States of America

Kris Bhaskar

USPTO Granted Patents = 31 

 

Average Co-Inventor Count = 4.3

ph-index = 10

Forward Citations = 471(Granted Patents)


Company Filing History:


Years Active: 2008-2025

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31 patents (USPTO):

Title: Innovator Spotlight: Kris Bhaskar - Revolutionizing Imaging and Metrology Technologies

Introduction:

Kris Bhaskar, a prolific inventor based in San Jose, CA, is known for his groundbreaking work in the field of imaging and metrology technologies. With an impressive portfolio of 30 patents, Bhaskar is leading the way in advancing defect detection and 3D structure inspection through innovative AI-driven solutions. Let's delve into his latest patents, career highlights, and collaborations that have shaped his remarkable journey in the tech industry.

Latest Patents:

Bhaskar's recent patents showcase his expertise in developing cutting-edge systems for joint defect discovery and optical mode selection. These patents encompass methodologies for detecting defects, accumulating data into mode selection datasets, training defect detection models, and determining run-time modes at an image pixel level. Additionally, his work in 3D structure inspection and metrology using deep learning highlights his contributions to predicting height and identifying defective structures on specimens with unparalleled accuracy.

Career Highlights:

Throughout his career, Kris Bhaskar has made significant contributions to companies like KLA-Tencor Corporation and KLA Corporation, where he has played a pivotal role in driving innovation in the semiconductor industry. His ability to translate complex technical concepts into practical solutions has earned him recognition as a thought leader in the field of advanced imaging technologies.

Collaborations:

Collaborating with talented individuals such as Jing Zhang and Brian Duffy has been instrumental in Kris Bhaskar's success. By leveraging collective expertise and diverse perspectives, Bhaskar and his colleagues have been able to push the boundaries of traditional metrology techniques, paving the way for more efficient and accurate inspection processes in manufacturing environments.

Conclusion:

In conclusion, Kris Bhaskar's relentless pursuit of excellence in imaging and metrology technologies has established him as a trailblazer in the industry. Through his dedicated efforts and innovative mindset, Bhaskar continues to make significant strides in revolutionizing how defects are detected and structures are inspected in high-tech manufacturing settings. His work not only showcases his technical prowess but also underscores his commitment to driving meaningful advancements in the field of semiconductor technology.

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