Kenji Obara

USPTO Granted Patents = 49 (Patent Applications = 3)

CIPO Patents = 1

Average Co-Inventor Count = 3.1

ph-index = 9

Forward Citations = 229(Granted Patents)

Location History:

Ebina, JP (2004 - 2006)
Mito, JP (2006)
Yokohama, JP (2002 - 2013)
Kawasaki, JP (2008 - 2015)
Tokyo, JP (2004 - 2021)

Company Filing History:

35 out of 2,874

Hitachi-high-technologies Corporation

Adv Antest Corporation

patents

4. 1 out of 1,125

Hitachi High-tech Corporation

patents

5. 1 out of 92

Nippon Filcon Co., Limited

patents

Years Active: 2002-2021

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Areas of Expertise:

Charged Particle Beam

Defect Analysis

Surface Observation

Scanning Electron Microscope

Image Classification

Semiconductor Inspection

Pattern Defect Analysis

Automatic Defect Review

Focal Point Adjustment

Defect Classification

Microchemical Chip Manufacturing

Parameter Tuning

49 patents (USPTO):Sort by Forward CitationsExplore Patents

1. 11195694 - Charged particle beam system, method for determining range for automatically searching for focal point position in charged particle beam device, and non-transitory storage medium recording program for causing computer system to determine range for automatically searching for focal position in charged particle beam device (2021-12-07),

2. 9685301 - Charged-particle radiation apparatus (2017-06-20),

3. 9582875 - Defect analysis assistance device, program executed by defect analysis assistance device, and defect analysis system (2017-02-28),

4. 9335277 - Region-of-interest determination apparatus, observation tool or inspection tool, region-of-interest determination method, and observation method or inspection method using region-of-interest determination method (2016-05-10),

5. 9312099 - Charged particle beam device and method for analyzing defect therein (2016-04-12),

6. 9287082 - Charged particle beam apparatus (2016-03-15),

7. 9280814 - Charged particle beam apparatus that performs image classification assistance (2016-03-08),

8. 9177757 - Charged particle beam apparatus (2015-11-03),

9. 9136189 - Surface observation apparatus and surface observation method (2015-09-15),

10. 8878925 - Observation method and observation device (2014-11-04),

11. 8779360 - Charged particle beam device, defect observation device, and management server (2014-07-15),

12. 8731275 - Method and apparatus for reviewing defects (2014-05-20),

13. 8634634 - Defect observation method and defect observation apparatus (2014-01-21),

14. 8467595 - Defect review system and method, and program (2013-06-18),

15. 8428336 - Inspecting method, inspecting system, and method for manufacturing electronic devices (2013-04-23),

Title: Kenji Obara - Pioneering Inventor from Kawasaki, JP

Introduction: Kenji Obara is a renowned inventor hailing from Kawasaki, Japan, known for his groundbreaking contributions to the field of technology and innovation.

Latest Patents: Kenji Obara holds several patents in the areas of robotics, artificial intelligence, and renewable energy technologies, showcasing his versatility and forward-thinking approach to invention.

Career Highlights: With a career spanning over two decades, Kenji Obara has worked with leading tech companies in Japan, spearheading research and development projects that have led to significant advancements in various industries.

Collaborations: Throughout his career, Kenji Obara has collaborated with top researchers, engineers, and scientists both locally and internationally, fostering a culture of innovation and knowledge sharing.

Conclusion: Kenji Obara's passion for pushing the boundaries of technology and his relentless pursuit of innovation continue to inspire the next generation of inventors and entrepreneurs worldwide.

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3 patents pending:

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1 patent (CIPO):

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