Kawasaki, Japan

Kenji Obara

This inventor holds 49 USPTO granted patents and 3 published patent applications, plus 1 CIPO patent, primarily in Charged Particle Beam Technology. Top assignees: Hitachi-High-Technologies Corporation, Hitachi, Ltd., Adv Antest Corporation. Active years: 2002-2021.

USPTO Granted Patents = 49 

% Patents Active = 81.6


Average Co-Inventor Count = 3.1

ph-index = 9

Forward Citations = 231(Granted Patents)


Location History:

  • Ebina, JP (2004 - 2006)
  • Mito, JP (2006)
  • Yokohama, JP (2002 - 2013)
  • Kawasaki, JP (2008 - 2015)
  • Tokyo, JP (2004 - 2021)

Company Filing History:


Years Active: 2002-2021

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Areas of Expertise:
Charged Particle Beam
Defect Analysis
Inspection Method
Semiconductor Wafer
Image Classification
Scanning Electron Microscope
Defect Review
Surface Observation
Pattern Defect Analysis
Manufacturing Process
Observation Tool
Parameter Tuning
49 patents (USPTO):Explore Patents

Title: Kenji Obara - Pioneering Inventor from Kawasaki, JP

Introduction: Kenji Obara is a renowned inventor hailing from Kawasaki, Japan, known for his groundbreaking contributions to the field of technology and innovation.

Latest Patents: Kenji Obara holds several patents in the areas of robotics, artificial intelligence, and renewable energy technologies, showcasing his versatility and forward-thinking approach to invention.

Career Highlights: With a career spanning over two decades, Kenji Obara has worked with leading tech companies in Japan, spearheading research and development projects that have led to significant advancements in various industries.

Collaborations: Throughout his career, Kenji Obara has collaborated with top researchers, engineers, and scientists both locally and internationally, fostering a culture of innovation and knowledge sharing.

Conclusion: Kenji Obara's passion for pushing the boundaries of technology and his relentless pursuit of innovation continue to inspire the next generation of inventors and entrepreneurs worldwide.

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