The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 15, 2016

Filed:

Feb. 07, 2015
Applicant:

Hitachi High-technologies Corporation, Minato-ku, Tokyo, JP;

Inventors:

Kenichi Morita, Tokyo, JP;

Sayaka Tanimoto, Tokyo, JP;

Makoto Sakakibara, Tokyo, JP;

Muneyuki Fukuda, Tokyo, JP;

Naomasa Suzuki, Tokyo, JP;

Kenji Obara, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J 37/141 (2006.01); H01J 37/28 (2006.01); H01J 37/26 (2006.01); H01J 37/22 (2006.01);
U.S. Cl.
CPC ...
H01J 37/141 (2013.01); H01J 37/222 (2013.01); H01J 37/261 (2013.01); H01J 2237/04922 (2013.01); H01J 2237/2801 (2013.01); H01J 2237/2806 (2013.01); H01J 2237/2809 (2013.01);
Abstract

A charged particle beam apparatus includes a charged particle beam source which irradiates a sample with a charged particle beam, an electromagnetic lens, a lens control electric source for controlling strength of a convergence effect of the electromagnetic lens; and a phase compensation circuit which is connected to the lens control electric source in parallel with the electromagnetic lens, and controls a lens current at the time of switching the strength of the convergence effect of the electromagnetic lens such that the lens current monotonically increases or monotonically decreases.


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