The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 23, 2013
Filed:
May. 11, 2006
Yoko Ikeda, Yokohama, JP;
Junko Konishi, Yokohama, JP;
Hisafumi Iwata, Hayama-machi, JP;
Yuji Takagi, Kamakura, JP;
Kenji Obara, Yokohama, JP;
Ryo Nakagaki, Kawasaki, JP;
Seiji Isogai, Hitachinaka, JP;
Yasuhiko Ozawa, Abiko, JP;
Yoko Ikeda, Yokohama, JP;
Junko Konishi, Yokohama, JP;
Hisafumi Iwata, Hayama-machi, JP;
Yuji Takagi, Kamakura, JP;
Kenji Obara, Yokohama, JP;
Ryo Nakagaki, Kawasaki, JP;
Seiji Isogai, Hitachinaka, JP;
Yasuhiko Ozawa, Abiko, JP;
Hitachi, Ltd., Tokyo, JP;
Abstract
A method for classifying defects, including: calculating feature quantifies of defect image which is obtained by imaging a defect on a sample; classifying the defect image into a classified category by using information on the calculated feature quantities; displaying the classified defect image in a region on a display screen which is defined to the classified category; adding information on the classified category to the displayed defect image; transferring the displayed defect image which is added the information on the classified category to one of the other categories and displaying the transferred defect image in a region on the display screen which is defined to the one of the other categories; and changing information on the category.