Enter inventor name

Yuji Takagi

This inventor holds 98 USPTO granted patents and 6 published patent applications, primarily in Defect Inspection (CPC class G06T2207-30148). Top assignees: Hitachi, Ltd., Hitachi-High-Technologies Corporation, Hitachi High-Tech Corporation. Active years: 1988-2025.

USPTO Granted Patents = 98 (Patent Applications = 6)

% Patents Active = 76.5

Average Co-Inventor Count = 3.9

ph-index = 19

Forward Citations = 1,162(Granted Patents)

Forward Citations (Not Self Cited) = 1,118(Dec 10, 2025)

Inventors with similar research interests:

🔬 See more inventors

Location History:

Yokahama, JP (1999)
Yokohama, JP (1988 - 2009)
Kamakura, JP (2002 - 2016)
Tokyo, JP (2003 - 2023)

Company Filing History:

Hitachi-High-Technologies Corporation

patents

11 out of 1,372

Hitachi High-Tech Corporation

Hitachi High-Thecnologies Corporation

patent

where one patent can have more than one assignee

Years Active: 1988-2025

Loading Chart...

Areas of Expertise:

Defect Detection

Charged Particle Beam

Semiconductor Wafer

Overlay Measurement

Electron Microscope

Pattern Inspection

Defect Classification

Defect Quantification

Sample Observation

Defect Review

Measurement Device

Inspection Method

98 patents (USPTO):Sort by Forward CitationsExplore Patents

1. 12444493 - Ambulance service support device, ambulance service support method, and program storage medium (2025-10-14),

2. 12260545 - Sample observation device and method (2025-03-25),

3. 12243711 - Method, apparatus, and program for determining condition related to captured image of charged particle beam apparatus (2025-03-04),

4. 12230119 - Control device, control method, and recording medium (2025-02-18),

5. 12142457 - Charged particle beam device (2024-11-12),

6. 11802841 - Defect detection device, defect detection method, and defect observation device (2023-10-31),

7. 11170483 - Sample observation device and sample observation method (2021-11-09),

8. 11087454 - Defect observation device and defect observation method (2021-08-10),

9. 10996569 - Measurement device, method and display device (2021-05-04),

10. 10977786 - Wafer observation device (2021-04-13),

11. 10971325 - Defect observation system and defect observation method for semiconductor wafer (2021-04-06),

12. 10810733 - Defect classification apparatus and defect classification method (2020-10-20),

13. 10783625 - Method for measuring overlay and measuring apparatus, scanning electron microscope, and GUI (2020-09-22),

14. 10770260 - Defect observation device (2020-09-08),

15. 10720307 - Electron microscope device and inclined hole measurement method using same (2020-07-21),

Title: Yuji Takagi: Pioneering Inventor from Kamakura

Introduction: Yuji Takagi is a renowned inventor hailing from the historic city of Kamakura, Japan. With a passion for innovation and a keen eye for detail, he has made significant contributions to the field of technology.

Latest Patents: Yuji Takagi holds several patents in the areas of robotics, artificial intelligence, and renewable energy. His most recent patents focus on sustainable solutions for urban development and smart city initiatives.

Career Highlights: Throughout his career, Yuji Takagi has worked with leading tech companies to bring his inventions to life. He has a proven track record of turning groundbreaking ideas into practical applications that benefit society as a whole.

Collaborations: Yuji Takagi has collaborated with top researchers and engineers from around the world to push the boundaries of technological advancement. His collaborative spirit and innovative mindset have led to the development of cutting-edge solutions in various industries.

Conclusion: In conclusion, Yuji Takagi stands as a visionary inventor who continues to shape the future of technology with his groundbreaking inventions. His dedication to innovation and commitment to excellence make him a true pioneer in his field.

Profile summary based on public USPTO records.

Please report any incorrect information to [email protected]