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Hitachi High-thecnologies Corporation

USPTO Granted Patents = 1

Forward Citations = 5

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4 inventors (with patents filed for the assignee):

Hidetoshi Morokuma (1 out of 73 patents)

Yuji Takagi (1 out of 98 patents)

Maki Tanaka (1 out of 93 patents)

4. Chie Shishido (1 out of 82 patents)

1 patent: Sort by Forward Citations

1. 7173268 - Method of measuring pattern dimension and method of controlling semiconductor device process (2007-02-06),

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USPTO Data Jan 1 1976 - Dec 23 2025

1 Patents

#5,735 in Tokyo

#15,539 in Japan

Hitachi High-thecnologies Corporation

Forward Citations = 5

4 inventors:

Hidetoshi Morokuma (1 out of 73 patents)

Yuji Takagi (1 out of 98 patents)

Maki Tanaka (1 out of 93 patents)

4. Chie Shishido (1 out of 82 patents)

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