Inventors with similar research interests:
Location History:
- Yokohama, JP (1998 - 2013)
- Kawasaki, JP (2009 - 2017)
- Tokyo, JP (2004 - 2019)
Company Filing History:
42 out of 2,874 
36 out of 42,485 
1 out of 1 
Years Active: 1998-2019
Title: Innovations in Imaging: The Patents of Chie Shishido
Introduction: Chie Shishido, an accomplished inventor based in Yokohama, Japan, has made significant contributions to the field of microscopy, holding an impressive total of 82 patents. His work focuses primarily on advancements in scanning electron microscopes, which play a crucial role in materials science and nanotechnology.
Latest Patents: Among his latest innovations, Shishido has developed a cutting-edge scanning electron microscope designed to accurately determine the characteristics of step patterns on samples, irrespective of the materials involved. This microscope features a beam source and a dual detection unit: the first detecting secondary electrons emitted at a controlled angle, and the second capturing those emitted at a steeper angle. Additionally, he has created a scanning electron microscope system aimed at inspecting holes with high aspect ratios commonly found in 3D-NAND processes. By using backscattered electrons generated from the bottom of these holes, the system can measure the depth and characteristics of the holes with remarkable precision, thus enhancing imaging quality in complex materials.
Career Highlights: Chie Shishido has had an illustrious career, working with leading companies in the technology sector including Hitachi High-Technologies Corporation and Hitachi, Ltd. His expertise in the field has allowed him to contribute to innovations that have substantial impacts on electronic and materials research.
Collaborations: Throughout his career, Shishido has collaborated with notable individuals in the industry, including Maki Tanaka and Takashi Hiroi. Their joint efforts have propelled many of his ideas into successful patents, demonstrating the importance of teamwork in scientific advancements.
Conclusion: Chie Shishido's contributions to the field of electron microscopy are evident through his extensive patent portfolio. With innovations that improve the accuracy and capability of scanning electron microscopes, he has established himself as a key figure in the scientific community, continually pushing the boundaries of technology and research.
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