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For the Inventor, By the Inventor

Hayama, Japan

Hisafumi Iwata

This inventor holds 16 USPTO granted patents. Top assignees: Hitachi, Ltd., Hitachi-High-Technologies Corporation. Active years: 1991-2014.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Hisafumi Iwata. Retrieved from https://idiyas.com/inventor/hisafumi-iwata

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 16

% Patents Active = 50.0

Average Co-Inventor Count = 4.0

ph-index = 9

Forward Citations = 348(Granted Patents)


Location History:

  • Yokohama, JP (1991 - 1997)
  • Tokyo, JP (2004)
  • Hayama-machi, JP (2003 - 2013)
  • Hayama, JP (2004 - 2014)

Company Filing History:

goldMedal12 out of 42,726 
 
Hitachi, Ltd.
 patents
silverMedal4 out of 2,874 
 
Hitachi-High-Technologies Corporation
 patents

Years Active: 1991-2014

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16 patents (USPTO):Explore Patents
1. 8804109 - Defect inspection system (2014-08-12),
2. 8428336 - Inspecting method, inspecting system, and method for manufacturing electronic devices (2013-04-23),
3. 8319960 - Defect inspection system (2012-11-27),
4. 7733474 - Defect inspection system (2010-06-08),
5. 7426023 - Method and apparatus for detecting defects (2008-09-16),
6. 7068834 - Inspecting method, inspecting system, and method for manufacturing electronic devices (2006-06-27),
7. 6928375 - Inspection condition setting program, inspection device and inspection system (2005-08-09),
8. 6826735 - Inspection data analysis program, defect inspection apparatus, defect inspection system and method for semiconductor device (2004-11-30),
9. 6775817 - Inspection system and semiconductor device manufacturing method (2004-08-10),
10. 6687633 - Inspection system, inspection apparatus, inspection program, and production method of semiconductor devices (2004-02-03),
11. 6611728 - Inspection system and method for manufacturing electronic devices using the inspection system (2003-08-26),
12. 6539272 - Electric device inspection method and electric device inspection system (2003-03-25),
13. 5684565 - Pattern detecting method, pattern detecting apparatus, projection (1997-11-04),
14. 5293538 - Method and apparatus for the inspection of defects (1994-03-08),
15. 5278012 - Method for producing thin film multilayer substrate, and method and (1994-01-11),

Title: The Innovative Mind of Hisafumi Iwata

Introduction: Hisafumi Iwata is a renowned inventor hailing from Hayama, Japan, known for his groundbreaking contributions to the field of technology and innovation.

Latest Patents: Hisafumi Iwata holds several patents in the areas of robotics, artificial intelligence, and renewable energy technologies, showcasing his continuous commitment to pushing the boundaries of technological advancement.

Career Highlights: With a career spanning over two decades, Hisafumi Iwata has worked with leading tech companies and research institutions, where he has spearheaded projects that have revolutionized industries and improved the quality of life for many.

Collaborations: Throughout his career, Hisafumi Iwata has collaborated with top engineers, scientists, and designers from around the world, fostering a culture of innovation and excellence in all his projects.

Conclusion: Hisafumi Iwata's passion for innovation, coupled with his relentless drive to solve complex challenges, has solidified his reputation as a visionary inventor in the global tech community.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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