The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 26, 2003
Filed:
Sep. 03, 1999
Natsuyo Morioka, Tokyo, JP;
Hisafumi Iwata, Hayama-machi, JP;
Junko Konishi, Yokohama, JP;
Yoko Ikeda, Yokohama, JP;
Kazunori Nemoto, Akishima, JP;
Makoto Ono, Yokohama, JP;
Yasuhiro Yoshitake, Yokosuka, JP;
Hitachi, Ltd., Tokyo, JP;
Abstract
An inspection system comprises an inspection machine for inspecting a work which is processed in one of the manufacturing processes of a manufacturing line and an analysis system for outputting an inspection history list obtained by making calculations from the inspected result. The inspection history list shows a matrix of first information as the inspection processes in which the work is inspected or the manufacturing processes corresponding to the inspection processes in which the work is inspected and second information as to the works inspected by the inspection machine.