Inventors with similar research interests:
Location History:
- Chiyoda-ku, Tokyo JP (2004)
- Yokosuka, JP (1997 - 2013)
- Yokohama, JP (1989 - 2020)
- Tokyo, JP (2003 - 2021)
Company Filing History:
38 out of 42,496 
12 out of 2,874 
2 out of 1,125 
Years Active: 1989-2021
Areas of Expertise:
Title: The Innovative Genius of Yasuhiro Yoshitake
Introduction: Yasuhiro Yoshitake, based in Yokohama, Japan, stands out as a prominent inventor with a remarkable portfolio of 60 patents. His groundbreaking inventions primarily focus on enhancing defect inspection technologies, which are crucial for various industries.
Latest Patents: Among his latest contributions to the field are two noteworthy patents. The first is a "Defect Inspection Apparatus," designed to improve the processing efficiency of defect inspections by enabling rapid adjustments in the positioning of detection systems. This apparatus includes essential components such as a movable stage for samples and a pattern substrate, an illumination optical system, and dual detection optical systems for analyzing scattered light. This technology implements advanced signal processing and control mechanisms for optimized performance.
The second patent revolves around a "Defect Inspection Device" and a corresponding "Pattern Chip." This innovative device irradiates sample surfaces or pattern chips with specially shaped illumination light to detect surface defects effectively. The pattern chip’s arrangement of multiple dots is strategically designed to enhance detection capabilities beyond standard resolutions.
Career Highlights: Yasuhiro has significantly contributed to renowned companies like Hitachi, Ltd. and Hitachi High-Technologies Corporation. His work in these organizations has not only advanced technological capabilities but has also earned him recognition as an expert in his field.
Collaborations: Throughout his career, Yasuhiro has collaborated with esteemed colleagues such as Toshihiko Nakata and Minoru Yoshida. These partnerships have helped foster an environment of creativity and innovation, further enhancing the technological advancements in defect inspection methods.
Conclusion: Yasuhiro Yoshitake’s contributions to innovation, particularly in defect inspection technologies, are a testament to his brilliance as an inventor. His patents not only reflect his expertise but also the potential for further advancements in industrial and scientific applications. Through his career at leading companies and collaborations with other innovators, Yoshitake continues to shape the future of technology.