The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 20, 2014
Filed:
Dec. 17, 2009
Keiko Oka, Yokohama, JP;
Yasuhiro Yoshitake, Yokohama, JP;
Keiko Oka, Yokohama, JP;
Yasuhiro Yoshitake, Yokohama, JP;
Hitachi, Ltd., Tokyo, JP;
Abstract
Disclosed are a spectroscopic optical system and a spectrometer both enabling vertical illumination by means of an optical system using only refractive lenses and enabling wide-band color correction in the DUV-UV (190 to 400 nm) range. The spectroscopic optical system and spectrometer each comprise a light source (), a folding mirror (), a field stop (), an object-side focusing lens system () for focusing light onto a sample, an image-side focusing lens () disposed on the image forming plane of the object-side focusing lens system, and a spectroscope () for dispersing regularly reflected light from the sample. The object-side focusing lens system () and the image-side focusing lens system () are each a spectroscopic optical system corrected with respect to color in a broad band of wavelength from 190 to 400 nm and configured from only refractive lenses enabling vertical illumination. The working distance (WD) of each lens is set shorter than a predetermined distance, and the doublet interval (D) is set longer than a predetermined distance.