Yokohama, Japan

Yoko Ikeda


Average Co-Inventor Count = 6.2

ph-index = 4

Forward Citations = 76(Granted Patents)


Company Filing History:


Years Active: 1998-2013

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4 patents (USPTO):Explore Patents

Title: Yoko Ikeda: Innovator in Electronic Device Inspection

Introduction

Yoko Ikeda is a prominent inventor based in Yokohama, Japan. He has made significant contributions to the field of electronic device manufacturing and inspection. With a total of 4 patents to his name, Ikeda's work focuses on improving the methods and systems used in the inspection of electronic devices.

Latest Patents

Ikeda's latest patents include innovative methods for inspecting electronic devices. One notable patent describes a method for classifying defects by calculating feature quantities of defect images obtained through imaging. This method allows for the classification of defect images into categories, displaying them on a screen, and transferring information between categories. Another patent outlines an inspecting system that utilizes an image detection device to produce multiple images of a workpiece. This system classifies detected images based on their features, enhancing the efficiency of the inspection process.

Career Highlights

Throughout his career, Yoko Ikeda has worked with leading companies in the technology sector. He has been associated with Hitachi, Ltd. and Mitsubishi Chemical Corporation, where he has applied his expertise in electronic device inspection and manufacturing.

Collaborations

Ikeda has collaborated with notable colleagues, including Hisafumi Iwata and Junko Konishi, who is a talented woman in the field. Their combined efforts have contributed to advancements in electronic device technology.

Conclusion

Yoko Ikeda's innovative work in the inspection of electronic devices has led to significant advancements in the industry. His patents reflect a commitment to improving manufacturing processes and ensuring quality in electronic devices.

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