The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 27, 2006
Filed:
Dec. 01, 1999
Yoko Ikeda, Yokohama, JP;
Junko Konishi, Yokohama, JP;
Hisafumi Iwata, Hayama-machi, JP;
Yuji Takagi, Kamakura, JP;
Kenji Obara, Yokohama, JP;
Ryo Nakagaki, Kawasaki, JP;
Seiji Isogai, Hitachinaka, JP;
Yasuhiko Ozawa, Abiko, JP;
Yoko Ikeda, Yokohama, JP;
Junko Konishi, Yokohama, JP;
Hisafumi Iwata, Hayama-machi, JP;
Yuji Takagi, Kamakura, JP;
Kenji Obara, Yokohama, JP;
Ryo Nakagaki, Kawasaki, JP;
Seiji Isogai, Hitachinaka, JP;
Yasuhiko Ozawa, Abiko, JP;
Hitachi, Ltd., Tokyo, JP;
Abstract
The present invention has an analyzing unit including an image detection device for producing a plurality of images of a workpiece, a storage for storing detected images produced by the image detection device, and a display having a screen with a first area for displaying a plurality of detected images stored in the storage and a plurality of second areas for classifying the detected images according to features of the detected images, whereby the plurality of detected images are moved on the screen from the first area to selected second areas to classify the plurality of detected images in the second areas.