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Kei Sakai

USPTO Granted Patents = 24 (Patent Applications = 2)

Average Co-Inventor Count = 3.9

ph-index = 2

Forward Citations = 10(Granted Patents)

Location History:

Hitachinaka, JP (2013 - 2015)
Heverlee, BE (2016)
Tokyo, JP (2017 - 2023)

Company Filing History:

13 out of 1,125

Hitachi High-tech Corporation

patents

11 out of 2,874

Hitachi-high-technologies Corporation

patents

Years Active: 2013-2025

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24 patents (USPTO):Sort by Forward CitationsExplore Patents

1. 12505976 - Charged particle beam apparatus and method for calculating roughness index (2025-12-23),

2. 12463005 - Correction coefficient calculation device, correction coefficient calculation method, and correction coefficient calculation program (2025-11-04),

3. 12354829 - Overlay measurement system and overlay measurement device for overlay error measurement using electron microscopy (2025-07-08),

4. 12347074 - Pattern measurement system, pattern measurement method, and program for measuring edge roughness at the edge of a pattern based on a random noise component (2025-07-01),

5. 12198327 - Measurement system, method for generating learning model to be used when performing image measurement of semiconductor including predetermined structure, and recording medium for storing program for causing computer to execute processing for generating learning model to be used when performing image measurement of semiconductor including predetermined structure (2025-01-14),

6. 11791130 - Electron beam observation device, electron beam observation system, and image correcting method and method for calculating correction factor for image correction in electron beam observation device (2023-10-17),

7. 11670481 - Charged particle beam device (2023-06-06),

8. 11626266 - Charged particle beam device (2023-04-11),

9. 11177112 - Pattern measurement device and non-transitory computer readable medium having stored therein program for executing measurement (2021-11-16),

10. 11170969 - Electron beam observation device, electron beam observation system, and control method of electron beam observation device (2021-11-09),

11. 11011346 - Electron beam device and image processing method (2021-05-18),

12. 10984980 - Charged particle beam device for imaging vias inside trenches (2021-04-20),

13. 10976536 - Image-forming device, and dimension measurement device (2021-04-13),

14. 10665420 - Charged particle beam apparatus (2020-05-26),

15. 10620421 - Image-forming device, and dimension measurement device (2020-04-14),

Title: Kei Sakai - Innovative Inventor from Tokyo

Introduction: Kei Sakai is a renowned inventor hailing from Tokyo, Japan, known for his groundbreaking contributions to various fields of technology and innovation.

Latest Patents: Kei Sakai holds several patents in the areas of robotics, artificial intelligence, and renewable energy, showcasing his versatility and forward-thinking approach to invention.

Career Highlights: With over two decades of experience in the industry, Kei Sakai has worked with leading research institutions and tech companies to develop cutting-edge solutions that have revolutionized the way we interact with technology.

Collaborations: Throughout his career, Kei Sakai has collaborated with top engineers, scientists, and designers from around the world, fostering a culture of innovation and creativity in all his projects.

Conclusion: Kei Sakai's passion for pushing the boundaries of what is possible through innovation and invention continues to inspire the next generation of inventors and entrepreneurs worldwide.

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