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For the Inventor, By the Inventor

Tokyo, Japan

Kei Sakai

This inventor holds 24 USPTO granted patents and 2 published patent applications, primarily in Charged Particle Beam Technology. Top assignees: Hitachi High-Tech Corporation, Hitachi-High-Technologies Corporation. Active years: 2013-2025.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Kei Sakai. Retrieved from https://idiyas.com/inventor/kei-sakai

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 24 

% Patents Active = 100.0

Average Co-Inventor Count = 3.9

ph-index = 2

Forward Citations = 10(Granted Patents)


Location History:

  • Hitachinaka, JP (2013 - 2015)
  • Heverlee, BE (2016)
  • Tokyo, JP (2017 - 2023)

Company Filing History:

goldMedal13 out of 1,395 
 
Hitachi High-Tech Corporation
 patents
silverMedal11 out of 2,874 
 
Hitachi-High-Technologies Corporation
 patents

Years Active: 2013-2025

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Areas of Expertise:
Charged Particle Beam
Pattern Measurement
Overlay Measurement
Electron Microscopy
Image Processing
Semiconductor Imaging
Roughness Index
Defect Inspection
Dimension Measurement
Correction Factor
Learning Model
Image Correction
24 patents (USPTO):Explore Patents
1. 12505976 - Charged particle beam apparatus and method for calculating roughness index (2025-12-23),
2. 12463005 - Correction coefficient calculation device, correction coefficient calculation method, and correction coefficient calculation program (2025-11-04),
3. 12354829 - Overlay measurement system and overlay measurement device for overlay error measurement using electron microscopy (2025-07-08),
4. 12347074 - Pattern measurement system, pattern measurement method, and program for measuring edge roughness at the edge of a pattern based on a random noise component (2025-07-01),
5. 12198327 - Measurement system, method for generating learning model to be used when performing image measurement of semiconductor including predetermined structure, and recording medium for storing program for causing computer to execute processing for generating learning model to be used when performing image measurement of semiconductor including predetermined structure (2025-01-14),
6. 11791130 - Electron beam observation device, electron beam observation system, and image correcting method and method for calculating correction factor for image correction in electron beam observation device (2023-10-17),
7. 11670481 - Charged particle beam device (2023-06-06),
8. 11626266 - Charged particle beam device (2023-04-11),
9. 11177112 - Pattern measurement device and non-transitory computer readable medium having stored therein program for executing measurement (2021-11-16),
10. 11170969 - Electron beam observation device, electron beam observation system, and control method of electron beam observation device (2021-11-09),
11. 11011346 - Electron beam device and image processing method (2021-05-18),
12. 10984980 - Charged particle beam device for imaging vias inside trenches (2021-04-20),
13. 10976536 - Image-forming device, and dimension measurement device (2021-04-13),
14. 10665420 - Charged particle beam apparatus (2020-05-26),
15. 10620421 - Image-forming device, and dimension measurement device (2020-04-14),

Title: Kei Sakai - Innovative Inventor from Tokyo

Introduction: Kei Sakai is a renowned inventor hailing from Tokyo, Japan, known for his groundbreaking contributions to various fields of technology and innovation.

Latest Patents: Kei Sakai holds several patents in the areas of robotics, artificial intelligence, and renewable energy, showcasing his versatility and forward-thinking approach to invention.

Career Highlights: With over two decades of experience in the industry, Kei Sakai has worked with leading research institutions and tech companies to develop cutting-edge solutions that have revolutionized the way we interact with technology.

Collaborations: Throughout his career, Kei Sakai has collaborated with top engineers, scientists, and designers from around the world, fostering a culture of innovation and creativity in all his projects.

Conclusion: Kei Sakai's passion for pushing the boundaries of what is possible through innovation and invention continues to inspire the next generation of inventors and entrepreneurs worldwide.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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