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For the Inventor, By the Inventor

Addison, TX, United States of America

Kayvan Sadra

USPTO Granted Patents = 15 

Average Co-Inventor Count = 3.1

ph-index = 4

Forward Citations = 242(Granted Patents)


Company Filing History:

goldMedal15 out of 29,232 
 
Texas Instruments Corporation
 patents

Years Active: 2004-2014

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15 patents (USPTO):Explore Patents
1. 8664968 - On-die parametric test modules for in-line monitoring of context dependent effects (2014-03-04),
2. 8216903 - SRAM cell with asymmetrical pass gate (2012-07-10),
3. 8211773 - SRAM cell with asymmetrical pass gate (2012-07-03),
4. 8067279 - Application of different isolation schemes for logic and embedded memory (2011-11-29),
5. 7795085 - Intentional pocket shadowing to compensate for the effects of cross-diffusion in SRAMs (2010-09-14),
6. 7662688 - Application of different isolation schemes for logic and embedded memory (2010-02-16),
7. 7384839 - SRAM cell with asymmetrical transistors for reduced leakage (2008-06-10),
8. 7341808 - Method and system for contiguous proximity correction for semiconductor masks (2008-03-11),
9. 7327591 - Staggered memory cell array (2008-02-05),
10. 7314800 - Application of different isolation schemes for logic and embedded memory (2008-01-01),
11. 7193277 - Application of different isolation schemes for logic and embedded memory (2007-03-20),
12. 7141468 - Application of different isolation schemes for logic and embedded memory (2006-11-28),
13. 7132340 - Application of post-pattern resist trim for reducing pocket-shadowing in SRAMs (2006-11-07),
14. 6968528 - Photo reticles using channel assist features (2005-11-22),
15. 6677766 - Shallow trench isolation step height detection method (2004-01-13),

Title: Innovations of Kayvan Sadra

Introduction

Kayvan Sadra is a prominent inventor based in Addison, Texas. He has made significant contributions to the field of integrated circuits and semiconductor technology. With a total of 15 patents to his name, Sadra has established himself as a key figure in innovation.

Latest Patents

One of his latest patents is titled "On-die parametric test modules for in-line monitoring of context dependent effects." This invention involves an integrated circuit (IC) die that features an on-die parametric test module. The module is designed to monitor context-dependent effects and includes a reference layout with active reference MOS transistors. Another notable patent is for an "SRAM cell with asymmetrical pass gate." This method addresses gate-induced drain leakage current in transistors, enhancing the performance of semiconductor devices.

Career Highlights

Kayvan Sadra is currently employed at Texas Instruments Corporation, where he continues to innovate and develop cutting-edge technologies. His work has had a significant impact on the semiconductor industry, particularly in the design and functionality of integrated circuits.

Collaborations

Some of his notable coworkers include Amitava Chatterjee and Theodore Warren Houston. Their collaborative efforts contribute to the advancement of technology at Texas Instruments Corporation.

Conclusion

Kayvan Sadra's contributions to the field of integrated circuits and semiconductor technology are noteworthy. His innovative patents and work at Texas Instruments Corporation highlight his role as a leading inventor in the industry.

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