Nirasaki, Japan

Junichi Hagihara

USPTO Granted Patents = 21 

Average Co-Inventor Count = 2.3

ph-index = 7

Forward Citations = 163(Granted Patents)


Location History:

  • Kofu, JP (1998)
  • Sendai, JP (2002 - 2003)
  • Nirasaki, JP (2006 - 2023)

Company Filing History:


Years Active: 1998-2024

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21 patents (USPTO):Explore Patents

Title: **Junichi Hagihara: Pioneer in Wafer Inspection Technologies**

Introduction

Junichi Hagihara, a prominent inventor from Nirasaki, Japan, has made significant contributions to the field of semiconductor technology. With a total of 21 patents to his name, Hagihara's work has played a crucial role in the advancement of wafer inspection systems, which are essential for ensuring the quality and reliability of semiconductors used in various electronic devices.

Latest Patents

Hagihara's latest innovative developments include a cutting-edge wafer inspection system. This system features a transfer region where a transfer device is located, an inspection region designated for housing test heads that inspect substrates, and a maintenance region for the upkeep of these test heads. The inspection region is strategically positioned between the transfer and maintenance regions, with multiple inspection rooms that can accommodate the test heads adjacently. A notable aspect of this design is the capability for the test heads to be unloaded from the inspection area to the maintenance region, enhancing operational efficiency.

Career Highlights

During his career, Hagihara has held significant positions in leading companies such as Tokyo Electron Limited and Ibiden Company Limited. His expertise and innovative mindset have enabled these organizations to advance in wafer inspection technologies, making processes more efficient and reliable.

Collaborations

Hagihara has collaborated with esteemed professionals in the field, including Kunihiro Furuya and Shigekazu Komatsu. These partnerships have fostered an environment of creativity and innovation, contributing to the successful development of new technologies in wafer inspection systems.

Conclusion

In conclusion, Junichi Hagihara stands out as a key inventor whose contributions are shaping the future of semiconductor technologies. His advancements in wafer inspection systems underscore the importance of innovation in ensuring the quality and performance of electronic components. With a strong track record of patents and collaborative efforts, he continues to influence the industry significantly.

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