San Jose, CA, United States of America

James S Vickers

This inventor holds 28 USPTO granted patents and 3 published patent applications, primarily in Integrated Circuit Testing. Top assignees: Tau-Metrix, Inc., Credence Systems Corporation, Dcg Systems Gmbh. Active years: 2003-2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: James S Vickers. Retrieved from https://idiyas.com/inventor/james-s-vickers

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 28 

% Patents Active = 67.9

Average Co-Inventor Count = 2.8

ph-index = 12

Forward Citations = 588(Granted Patents)


Location History:

  • Jamaica Plain, MA (US) (2003 - 2008)
  • Jamaica Plains, MA (US) (2003 - 2009)
  • San Jose, CA (US) (2004 - 2023)

Company Filing History:


Years Active: 2003-2026

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Areas of Expertise:
Probe Landing Detection
Scanning Electron Microscope
Charged Particle Beams
Laser Voltage Imaging
Polarization Diversity Imaging
Integrated Photodiode
Test Structures
Bi-Convex Solid Immersion Lens
Non-Invasive Diagnostics
Photon Counting
Thermoelectrically Cooled Photodetector
28 patents (USPTO):Explore Patents

Title: James S Vickers: Innovator in Integrated Circuit Technologies

Introduction

James S Vickers is a prominent inventor based in San Jose, California, famed for his significant contributions to the field of integrated circuits. With an impressive portfolio of 26 patents, Vickers has established himself as a leader in innovative solutions for diagnostic and characterization methods in semiconductor technology.

Latest Patents

Two of Vickers' latest patents showcase his groundbreaking work. The first, titled "System and method of preparing integrated circuits for backside probing using charged particle beams," describes a sophisticated method that allows integrated circuits (ICs) to remain electrically active while their active circuitry can be probed using charged particle beams. This system incorporates an infrared camera that can visualize electrical circuits through the silicon substrate, a focused ion beam system for imaging and material removal, and a scanning electron microscope for imaging structures and measuring voltage contrast signals. The method employs this advanced system to identify probing regions and selectively remove substrate material, facilitating the observation of electrical states on active ICs.

The second patent, "Laser-assisted device alteration using synchronized laser pulses," introduces a pulsed-laser system designed to enhance spatial resolution through temporal resolution. This innovative system can resolve complementary metal-oxide-semiconductor (CMOS) pairs within its illumination target by synchronizing laser pulses with the device under test (DUT) clock signal. This technology has versatile applications, either utilizing laser wavelengths above or below the silicon bandgap, providing flexibility in achieving single-photon or two-photon interactions.

Career Highlights

Throughout his esteemed career, James S Vickers has worked with notable companies in the semiconductor field, including Tau-Metrix, Inc. and Credence Systems Corporation. His contributions have led to innovative approaches in test and measurement solutions.

Collaborations

Vickers has collaborated with several talented individuals in the industry, including Nader Pakdaman and Majid Aghababazadeh. These partnerships have furthered advancements in semiconductor technologies and diagnostics, showcasing the collaborative nature of innovation in the field.

Conclusion

James S Vickers continues to be an influential figure in the domain of integrated circuits, contributing valuable patents that promote progress in technology. His work not only enhances existing methodologies but also paves the way for future innovations, solidifying his legacy as a distinguished inventor and innovator.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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