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For the Inventor, By the Inventor

Erlangen, Germany

Dcg Systems Gmbh


USPTO Granted Patents = 55


Forward Citations = 332

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83 inventors (with patents filed for the assignee):

goldMedal Theodore R Lundquist (10 out of 24 patents)

silverMedal Steven Kasapi (9 out of 24 patents)

bronzeMedal Jonathan Frank (5 out of 13 patents)

4.  Chun-Cheng Tsao (5 out of 12 patents)

5.  James S Vickers (4 out of 26 patents)

6.  Keith Serrels (4 out of 7 patents)

7.  Prasad Sabbineni (4 out of 10 patents)

8.  Herve Deslandes (4 out of 10 patents)

9.  Rudolf Schlangen (4 out of 4 patents)

10.  Thomas Wong (4 out of 12 patents)

11.  Tahir Cader (3 out of 101 patents)

12.  Vladimir Ukraintsev (3 out of 13 patents)

13.  Richard Stallcup (3 out of 4 patents)

14.  Sergiy Pryadkin (3 out of 4 patents)

15.  Mike Berkmyre (3 out of 5 patents)


Core Competencies:
Laser Voltage Imaging
Non-Contact Microscopy
Thermal Management Systems
Photoemission-Based Defect Detection
FIB Data Analysis
Polarization Diversity Imaging
Three-Dimensional Hot Spot Localization
Modulation Mapping
Adaptive Probing Techniques
Optical Interference Fringe Processing
Semiconductor Probing
Device Failure Analysis

55 patents:

1. 11047906 - Synchronized pulsed LADA for the simultaneous acquisition of timing diagrams and laser-induced upsets (2021-06-29),
2. 10761039 - Method for examination of a sample by means of the lock-in thermography (2020-09-01),
3. 10191111 - Synchronized pulsed LADA for the simultaneous acquisition of timing diagrams and laser-induced upsets (2019-01-29),
4. 9551743 - Apparatus and method for combined micro-scale and nano-scale C-V, Q-V, and I-V testing of semiconductor materials (2017-01-24),
5. 9506947 - System and method for non-contact microscopy for three-dimensional pre-characterization of a sample for fast and non-destructive on sample navigation during nanoprobing (2016-11-29),
6. 9361533 - Apparatus and method for polarization diversity imaging and alignment (2016-06-07),
7. 9322715 - Three-dimensional hot spot localization (2016-04-26),
8. 9244121 - Systems and method for laser voltage imaging state mapping (2016-01-26),
9. 9239357 - System and method for modulation mapping (2016-01-19),
10. 9201096 - Laser-assisted device alteration using synchronized laser pulses (2015-12-01),
11. 9098892 - Lock in thermal laser stimulation through one side of the device while acquiring lock-in thermal emission images on the opposite side (2015-08-04),
12. 9064083 - P and N region differentiation for image-to-CAD alignment (2015-06-23),
13. 9057740 - Probe-based data collection system with adaptive mode of probing (2015-06-16),
14. 9025020 - Lock in thermal laser stimulation through one side of the device while acquiring lock-in thermal emission images on the opposite side (2015-05-05),
15. 8983232 - Method for evaluating the centerline of an arbitrarily shaped object (2015-03-17),
DCG Systems GmbH is a leading provider of semiconductor testing solutions. With a strong focus on advanced process control and yield management, DCG Systems helps semiconductor manufacturers optimize their production processes and improve yields. Their innovative technologies and comprehensive solutions are trusted by leading semiconductor companies worldwide. Visit their website for more information and to explore their product offerings.
This text is generated by artificial intelligence and may not be accurate.

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USPTO Data Jan 1 1976 - Dec 23 2025

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55 Patents

#8 in Erlangen

#998 in Germany

#12,536 in the World

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Erlangen, Germany

Dcg Systems Gmbh

Forward Citations = 332

83 inventors:

goldMedal Theodore R Lundquist (10 out of 24 patents)

silverMedal Steven Kasapi (9 out of 24 patents)

bronzeMedal Jonathan Frank (5 out of 13 patents)

4.  Chun-Cheng Tsao (5 out of 12 patents)

5.  James S Vickers (4 out of 26 patents)

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