Location History:
- Plano, TX (US) (2014 - 2016)
- McKinney, TX (US) (2018)
Company Filing History:
Years Active: 2014-2018
Title: Innovations of Inventor Sergiy Pryadkin
Introduction
Sergiy Pryadkin is a notable inventor based in Plano, TX (US), recognized for his contributions to the field of integrated circuit testing and microscopy. With a total of four patents to his name, Pryadkin has made significant advancements in probe-based data collection systems and non-contact microscopy techniques.
Latest Patents
One of his latest patents is a "Probe-based data collection system with adaptive mode of probing controlled by local sample properties." This innovative method involves testing an integrated circuit (IC) using a nanoprobe, which is registered to an identified feature on the IC through a scanning electron microscope (SEM). The process includes navigating the nanoprobe to a region of interest and scanning the surface of the IC while reading data. When the nanoprobe detects a feature of interest, the scanning speed is decelerated, allowing for more precise testing of the IC. Additionally, the scanning can be performed at a prescribed nanoprobe tip force, with an increase in tip force during the deceleration phase.
Another significant patent is the "System and method for non-contact microscopy for three-dimensional pre-characterization of a sample for fast and non-destructive on-sample navigation during nanoprobing." This system is designed to perform sample probing using a topography microscope that receives three-dimensional coordinates based on fiducial marks. It allows for efficient navigation to specific locations on the sample, enhancing the accuracy and speed of the probing process.
Career Highlights
Throughout his career, Sergiy Pryadkin has worked with several prominent companies, including DCG Systems GmbH and FEI EFA, Inc. His experience in these organizations has contributed to his expertise in the development of advanced probing technologies.
Collaborations
Pryadkin has collaborated with notable professionals in his field, including Vladimir Ukraintsev and Richard Stallcup. These collaborations have further enriched his work and innovations in the realm of integrated circuit testing and microscopy.
Conclusion
Sergiy Pryadkin's innovative contributions to probe-based data collection and microscopy have established him as a significant figure in his field. His patents reflect a commitment to advancing technology and improving testing methodologies for integrated circuits.